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Wavelength-Dispersive X-Ray Spectrometry

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Modern Developments and Applications in Microbeam Analysis

Part of the book series: Mikrochimica Acta Supplement ((MIKROCHIMICA,volume 15))

Abstract

The mode of operation of wavelength-dispersive (WD) spectrometers as used in EPMA is described. Factors governing the resolution and intensity obtained with different crystals are discussed, with a view to assessing the scope for improvement and helping the user to make suitable choices of operating conditions. High-order reflections and continuum background are also considered. Trace element detection limits as determined by peak intensity and peak-to-background ratio have been estimated. Computer modelling as an aid to selecting optimum conditions for WD analysis is discussed, with special reference to the ‘Virtual WDS’ program.

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References

  1. R. Rybka, R. C. Wolf, in: X-ray Spectrometry in Electron Beam Instruments, ( D. B. Williams, J. I. Goldstein, D. E. Newbury, eds.), Plenum, New York, 1995, p. 287.

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Author information

Authors and Affiliations

  1. Department of Earth Sciences, University of Cambridge, Downing St., Cambridge, CB2 3EQ, England, UK

    Stephen J. B. Reed

Authors
  1. Stephen J. B. Reed
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Editor information

Editors and Affiliations

  1. Centre for Electron Optical Studies, University of Bath, UK

    Glyn Love

  2. Department of Physics and Astronomy, University of Glasgow, UK

    W. A. Patrick Nicholson

  3. Istituto LAMEL, C.N.R., Bologna, Italy

    Aldo Armigliato

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© 1998 Springer-Verlag Wien

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Reed, S.J.B. (1998). Wavelength-Dispersive X-Ray Spectrometry. In: Love, G., Nicholson, W.A.P., Armigliato, A. (eds) Modern Developments and Applications in Microbeam Analysis. Mikrochimica Acta Supplement, vol 15. Springer, Vienna. https://doi.org/10.1007/978-3-7091-7506-4_4

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  • DOI: https://doi.org/10.1007/978-3-7091-7506-4_4

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-83106-9

  • Online ISBN: 978-3-7091-7506-4

  • eBook Packages: Springer Book Archive

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