Abstract
A method of determination of the thermal diffusivity of semiconductors is proposed where a one-dimensional analysis is adequate, using the relative influence of the thermal properties of the sample and backing on the phase of the photothermal deflection spectroscopy (PDS) signal.
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© 1988 Springer-Verlag Berlin Heidelberg
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Yacoubi, N., Fathallah, M. (1988). Spectroscopic Determination of Thermal Diffusivity of Semiconductors by Photothermal Deflection Spectroscopy: Application to GaAs. In: Hess, P., Pelzl, J. (eds) Photoacoustic and Photothermal Phenomena. Springer Series in Optical Sciences, vol 58. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-48181-2_90
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DOI: https://doi.org/10.1007/978-3-540-48181-2_90
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-13705-5
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