Abstract
Deliberate injection of faults into cryptographic devices is an effective cryptanalysis technique against symmetric and asymmetric encryption algorithms. In this paper we will describe parity code based concurrent error detection (CED) approach against such attacks in substitution-permutation network (SPN) symmetric block ciphers [22]. The basic idea compares a carefully modified parity of the input plain text with that of the output cipher text resulting in a simple CED circuitry. An analysis of the SPN symmetric block ciphers reveals that on one hand, permutation of the round outputs does not alter the parity from its input to its output. On the other hand, exclusive-or with the round key and the non-linear substitution function (s-box) modify the parity from their inputs to their outputs. In order to change the parity of the inputs into the parity of outputs of an SPN encryption, we exclusive-or the parity of the SPN round function output with the parity of the round key. We also add to all s-boxes an additional 1-bit binary function that implements the combined parity of the inputs and outputs to the s-box for all its (input, output) pairs. These two modifications are used only by the CED circuitry and do not impact the SPN encryption or decryption. The proposed CED approach is demonstrated on a 16-input, 16-output SPN symmetric block cipher from [1].
Chapter PDF
Similar content being viewed by others
Keywords
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
References
Heys, H.: A tutorial on linear and differential cryptanalysis, http://citeseer.nj.nec.com/443539.html
Biham, E., Shamir, A.: Differential Cryptanalysis of DES-like Crytptosystems. Journal of Cryptography 4(1), 3–72 (1991)
Matsui, M.: Linear Cryptanalysis Method for DES Cipher. In: Helleseth, T. (ed.) EUROCRYPT 1993. LNCS, vol. 765, pp. 386–397. Springer, Heidelberg (1994)
Kelsey, J., Schneier, B., Wagner, D., Hall, C.: Side-Channel Cryptanalysis of Product Ciphers. In: Quisquater, J.-J., Deswarte, Y., Meadows, C., Gollmann, D. (eds.) ESORICS 1998. LNCS, vol. 1485, pp. 97–110. Springer, Heidelberg (1998)
Boneh, D., DeMillo, R., Lipton, R.: On the importance of checking cryptographic protocols for faults. In: Fumy, W. (ed.) EUROCRYPT 1997. LNCS, vol. 1233, pp. 37–51. Springer, Heidelberg (1997)
Biham, E., Shamir, A.: Differential Fault Analysis of Secret Key Cryptosystems. In: Kaliski Jr., B.S. (ed.) CRYPTO 1997. LNCS, vol. 1294, pp. 513–525. Springer, Heidelberg (1997)
Anderson, R.J., Kuhn, M.: Low cost attack on tamper resistant devices. In: Christianson, B., Lomas, M. (eds.) Security Protocols 1997. LNCS, vol. 1361. Springer, Heidelberg (1998)
Aumuller, C., Bier, P., Hofreiter, P., Fischer, W., Seifert, J.-P.: Fault attacks on RSA with CRT: concrete results and practical countermeasures, http://www.iacr.org/eprint/2002/072.pdf
Bloemer, J., Seifert, J.-P.: Fault based cryptanalysis of the Advanced Encryption Standard, http://www.iacr.org/eprint/2002/075.pdf
Rivest, R.L., Robshaw, M.J.B., Sidney, R., Yin, Y.L.: The RC6 block cipher, ftp://ftp.rsasecurity.com/pub/rsalabs/aes/rc6v11.pdf
Bonnenberg, H., Curiger, A., Felber, N., Kaeslin, H., Zimmermann, R., Fichtner, W.: VINCI: Secure test of a VLSI high-speed encryption system. In: Proceedings of IEEE International Test Conference, October 1993, pp. 782–790 (1993)
Daemen, J., Rijmen, V.: AES proposal: Rijndael, http://www.esat.kuleuven.ac.be/~rijmen/rijndael/rijndaeldocV2.zip
Wolter, S., Matz, H., Schubert, A., Laur, R.: On the VLSI implementation of the International Data Encryption Algorithm IDEA. In: IEEE International symposium on Circuits and Systems, vol. 1, pp. 397–400 (1995)
Karri, R., Wu, K., Mishra, P., Kim, Y.: Concurrent Error Detection of Fault Based Side- Channel Cryptanalysis of 128-Bit Symmetric Block Ciphers. IEEE Transactions on CAD (December 2002)
Bertoni, G., Breveglieri, L., Koren, I., Piuri, V.: On the propagation of faults and their detection in a hardware implementation of the advanced encryption standard. In: Proceedings of ASAP 2002, pp. 303–312 (2002)
Fernandez-Gomez, S., Rodriguez-Andina, J.J., Mandado, E.: Concurrent Error Detection in Block Ciphers. In: IEEE International Test Conference (October 2000)
Butter, A.S., Kao, C.Y., Kuruts, J.P.: DES encryption and decryption unit with error checking. US patent US5432848 (July 1995)
Bertoni, G., Breveglieri, L., Koren, I., Maistri, P., Piuri, V.: A parity code based fault detection for an implementation of the advanced encryption standard. In: Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI, November 2002, pp. 51–59 (2002)
Bertoni, G., Breveglieri, L., Koren, I., Piuri, V.: Error Analysis and Detection Procedures for a Hardware Implementation of the Advanced Encryption Standard. IEEE Transactions on Computers 52(4), 492–505 (2003)
Webster, A.F., Tavares, S.E.: On the design of S-boxes. In: Williams, H.C. (ed.) CRYPTO 1985. LNCS, vol. 218, pp. 523–534. Springer, Heidelberg (1986)
Heys, H., Tavares, S.E.: Avalanche characteristics of substitution permutation encryption networks. IEEE Transactions on Computers 44(9), 1131–1139 (1995)
Karri, R., Goessel, M., Kousnezow, G.: Method for error detection in kryptographic substitution permutation networks. patent application pending
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2003 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Karri, R., Kuznetsov, G., Goessel, M. (2003). Parity-Based Concurrent Error Detection of Substitution-Permutation Network Block Ciphers. In: Walter, C.D., Koç, Ç.K., Paar, C. (eds) Cryptographic Hardware and Embedded Systems - CHES 2003. CHES 2003. Lecture Notes in Computer Science, vol 2779. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-45238-6_10
Download citation
DOI: https://doi.org/10.1007/978-3-540-45238-6_10
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-40833-8
Online ISBN: 978-3-540-45238-6
eBook Packages: Springer Book Archive