Abstract
Direct digitization of the preamplifier output of a Si(Li) detector, with all subsequent pulse processing performed digitally, enhances throughput versus resolution performance Sensitivity, resolution, and especially pileup rejection for photons below 1 keV are also improved. Adaptive pulse shaping allows both low dead time operation with minimal loss of resolution and automatic adjustment to a wide range of beam current without requiring manual selection of processing time.
An overview of the operating principles of a digital pulse processor will be presented and compared with conventional approaches. Examples of spectra taken with the same spectrometer under the same conditions, changing only the pulse processors, will illustrate the advantages of adaptive digital processing.
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Mott, R.B., Friel, J.J. (1995). Improving EDS Performance with Digital Pulse Processing. In: Williams, D.B., Goldstein, J.I., Newbury, D.E. (eds) X-Ray Spectrometry in Electron Beam Instruments. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-1825-9_9
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