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Determination of Strain and Stress Fields by Diffraction Methods

  • Chapter
Residual Stress

Part of the book series: Materials Research and Engineering ((MATERIALS))

Abstract

Up to this point the mechanical and micromechanical behavior of solids and basic concepts of x-ray and neutron scattering from crystalline solids have been presented. In this chapter these concepts are combined in the derivation of the basic equations of residual stress determination with diffraction. The fundamental assumptions inherent in these derivations and the limits they impose on the applicability of the stress measurement will also be discussed. Various problems in an actual stress measurement, such as the effect of stress gradients, the separation of micro and macrostresses, determination of stresses in thin films and single crystals, etc., are also considered, with special emphasis on the interpretation of the data within the limitations of the theory.

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Author information

Authors and Affiliations

  1. Thomas J. Watson Research Center, IBM, P.O. Box 218, Yorktown Heights, NY, 10598, USA

    Dr. Ismail C. Noyan

  2. Dept. of Materials Science and Engineering, The Technological Institute, Northwestern University, Evanston, IL, 60201, USA

    Prof. Jerome B. Cohen (Dean)

Authors
  1. Dr. Ismail C. Noyan
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  2. Prof. Jerome B. Cohen
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© 1987 Springer-Verlag New York Inc.

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Noyan, I.C., Cohen, J.B. (1987). Determination of Strain and Stress Fields by Diffraction Methods. In: Residual Stress. Materials Research and Engineering. Springer, New York, NY. https://doi.org/10.1007/978-1-4613-9570-6_5

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  • DOI: https://doi.org/10.1007/978-1-4613-9570-6_5

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4613-9571-3

  • Online ISBN: 978-1-4613-9570-6

  • eBook Packages: Springer Book Archive

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