Skip to main content

Classification of Defects in Bushes Using Deep Learning Approaches

  • Conference paper
  • First Online:
Smart Sensors Measurements and Instrumentation

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 750))

  • 557 Accesses

Abstract

Bush manufacturing industries generate thousands of bushes every day. The quality of the product is very crucial; if not it often leads to a huge loss for the manufacturer. The bushes are made up of steel material, highly reflective, and cylindrical shapes. Typically, the bushes have several types of defects that include cracks on the surface, unfinished surfaces, dent, etc. The manual inspection is carried out to check the product quality which is very tedious and time-consuming. Hence, we address the necessity for automated inspection of these bushes for classification of defect and non-defect. The conventional methods often fail to automate the process because the size of the crack is minute, or the algorithms are not efficient. In this paper, we aim to solve the problem using a deep learning approach. A combination of multiple cameras are employed to collect the sample dataset, and convolutional neural network is employed for binary and multi-class classification of the defect types. The proposed method performed better with the accuracy of 99.85% for binary classification and 89.32% for multiclass classification for the test data. In addition, we compare the accuracy with state-of-the-art deep learning techniques.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Similar content being viewed by others

References

  1. Evgeniou, T., Pontil, M.: Support vector machines: theory and applications. In: Advanced Course on Artificial Intelligence (pp. 249–257). Springer, Berlin, Heidelberg (1999).

    Google Scholar 

  2. LeCun, Y., Bottou, L., Bengio, Y., Haffner, P.: Gradient-based learning applied to document recognition. Proc. IEEE 86(11), 2278–2324 (1998)

    Article  Google Scholar 

  3. Simonyan, K., Zisserman, A.: Very deep convolutional networks for large-scale image recognition (2014). arXiv preprint arXiv:1409.1556

  4. He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 770–778 (2016).

    Google Scholar 

  5. Krizhevsky, A., Sutskever, I., Hinton, G.E.: Imagenet classification with deep convolutional neural networks. In: Advances in Neural Information Processing Systems, pp. 1097–1105 (2012)

    Google Scholar 

Download references

Acknowledgements

We would like to thank the Shri Madhwa Tech solutions for providing the hardware set up for the experiment.

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2021 The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Kushagra, I.S., Rakshith, R., Toraskar, S., Gujaran, R.J., Asha, C.S. (2021). Classification of Defects in Bushes Using Deep Learning Approaches. In: K V, S., Rao, K. (eds) Smart Sensors Measurements and Instrumentation. Lecture Notes in Electrical Engineering, vol 750. Springer, Singapore. https://doi.org/10.1007/978-981-16-0336-5_15

Download citation

Publish with us

Policies and ethics