Abstract
Scanning Force Microscopes are built in wide variety of designs. This article reviews setups and design concepts for contact and non-contact mode instruments and for friction mode instruments. The principles of operation of various designs is reviewed. The performance of scanning probe microscopes depends crucially on the mechanical properties of a particular design. In order to help users evaluate microscopes or to build them this article reviews some common design practices and rules.
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Marti, O., Colchero, J. (1995). Scanning Probe Microscopy Instrumentation. In: Güntherodt, H.J., Anselmetti, D., Meyer, E. (eds) Forces in Scanning Probe Methods. NATO ASI Series, vol 286. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0049-6_2
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DOI: https://doi.org/10.1007/978-94-011-0049-6_2
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