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Atomistic Theory of the Interaction Between AFM Tips and Ionic Surfaces

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Forces in Scanning Probe Methods

Part of the book series: NATO ASI Series ((NSSE,volume 286))

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Abstract

We discuss the results of atomistic calculations of the interaction between three different types of AFM tips composed of MgO and SiO2, and perfect and defective (001) surfaces of LiF, NaCl and CaO.

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References

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Author information

Authors and Affiliations

  1. The Royal Institution of Great Britain, 21 Albemarle St., London, W1X 4BS, UK

    A. L. Shluger, A. L. Rohl, D. H. Gay & R. T. Williams

  2. Department of Physics, Wake Forest University, Winston-Salem, NC, 27109, USA

    R. T. Williams

Authors
  1. A. L. Shluger
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  2. A. L. Rohl
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  3. D. H. Gay
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  4. R. T. Williams
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Editor information

Editors and Affiliations

  1. Institute of Physics, University of Basel, Basel, Switzerland

    H. J. Güntherodt  & E. Meyer  & 

  2. Ciba Geigy Ltd., Central Research Services Physics, K-127.1.50, Basel, Switzerland

    D. Anselmetti

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© 1995 Springer Science+Business Media Dordrecht

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Shluger, A.L., Rohl, A.L., Gay, D.H., Williams, R.T. (1995). Atomistic Theory of the Interaction Between AFM Tips and Ionic Surfaces. In: Güntherodt, H.J., Anselmetti, D., Meyer, E. (eds) Forces in Scanning Probe Methods. NATO ASI Series, vol 286. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0049-6_17

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  • DOI: https://doi.org/10.1007/978-94-011-0049-6_17

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4027-3

  • Online ISBN: 978-94-011-0049-6

  • eBook Packages: Springer Book Archive

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