Abstract
Field emission of electrons from multiwall carbon nanotubes (MWCNTs) has been investigated by field emission microscopy (FEM) in an ultra-high vacuum chamber. An MWCNT whose tip is capped by curved graphite layers gives a FEM pattern consisting of 6 bright pentagons when the surface of the nanotube tip is clean. Even in the ultra-high vacuum with a base pressure of about 10−10 Ton, residual gas molecules, coming from the nanotube shank through field-enhanced migration or directly from the gas phase by polarization forces, adsorb on the nanotube tips. The adsorbed molecules reside preferentially on the pentagonal sites, giving bright spots in the FEM pattern. A flash heating of the emitter at about 1300 K allows the molecules to desorb, and the nanotube emitter recovers the original clean surfaces. The adsorption and desorption of gas molecules are responsible for step-wise increases and decreases in the emission current, respectively. Energy spectra of electrons from a clean pentagon and through an adsorbed molecule are measured individually. For a clean surface a subpeak is observed at about 0.5 eV lower than the main peak, while the subpeak disappeared for the adsorbed surface.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
Y. Saito, S. Uemura and K. Hamaguchi, Jpn. J. Appl. Phys. 37 (1998) L346.
S. Uemura, T. Nagasako, J. Yotani, T. Shimojo and Y. Saito, SID ’98 Digest (1998) 1052.
W. B. Choi, D. S. Chung, S. H. Park and J. M. Kim, SID ’99 Digest (1999) 1134.
Y. Saito, K. Hata and T. Murata, Jpn. J. Appl. Phys. 39 (2000) L271.
K. A. Dean and B. R. Chalamla, Appl. Phys. Lett. 76 (2000) 375.
Y. Saito, R. Mizushima, S. Kondo and M. Maida, Jpn. J. Appl. Phys. 39 (2000) 1468.
H. Ibach, “Electron Energy Loss Spectrometers”, ( Springer-Verlag, Berlin, 1991 ).
T. Nagao, K. Kitamura, T. Iizuka, M. Umeuchi, T. Shimazaki, C. Oshima and S. Otani, Surf. Sci. 287 /288 (1993) 391.
T. Nagao, K. Kitamura, T. Iizuka, M. Umeuchi, T. Shimazaki, C. Oshima and S. Otani, Ibid. 290 (1993) 436.
R. Tamura and M. Tsukada, Phys. Rev. B 52 (1995) 6015.
Y. Saito, K. Hamaguchi, T. Nishino, K. Hata, K. Tohji, A. Kasuya and Y. Nishina, Jpn. J. Appl. Phys. 36 (1997) L1340.
Y. Saito and S. Uemura, Carbon 38 (2000) 169.
S. Yamamoto, S. Hosoki, S. Fukuhara and M. Futamoto, Surf. Sci. 86 (1979) 734.
V. T. Binh, S. T. Purcell, N. Garcia and J. Doglioni, Phys. Rev. Lett. 69 (1992) 2527.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2002 Kluwer Academic Publishers
About this chapter
Cite this chapter
Saito, Y., Hata, K., Takakura, A., Matsuda, K., Kona, T., Ohshima, C. (2002). Field Emission Microscopy of Carbon Nanotubes. In: Ōsawa, E. (eds) Perspectives of Fullerene Nanotechnology. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-9598-3_5
Download citation
DOI: https://doi.org/10.1007/978-94-010-9598-3_5
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-9600-3
Online ISBN: 978-94-010-9598-3
eBook Packages: Springer Book Archive