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Field Emission Microscopy of Carbon Nanotubes

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Perspectives of Fullerene Nanotechnology

Abstract

Field emission of electrons from multiwall carbon nanotubes (MWCNTs) has been investigated by field emission microscopy (FEM) in an ultra-high vacuum chamber. An MWCNT whose tip is capped by curved graphite layers gives a FEM pattern consisting of 6 bright pentagons when the surface of the nanotube tip is clean. Even in the ultra-high vacuum with a base pressure of about 10−10 Ton, residual gas molecules, coming from the nanotube shank through field-enhanced migration or directly from the gas phase by polarization forces, adsorb on the nanotube tips. The adsorbed molecules reside preferentially on the pentagonal sites, giving bright spots in the FEM pattern. A flash heating of the emitter at about 1300 K allows the molecules to desorb, and the nanotube emitter recovers the original clean surfaces. The adsorption and desorption of gas molecules are responsible for step-wise increases and decreases in the emission current, respectively. Energy spectra of electrons from a clean pentagon and through an adsorbed molecule are measured individually. For a clean surface a subpeak is observed at about 0.5 eV lower than the main peak, while the subpeak disappeared for the adsorbed surface.

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References

  1. Y. Saito, S. Uemura and K. Hamaguchi, Jpn. J. Appl. Phys. 37 (1998) L346.

    Article  CAS  Google Scholar 

  2. S. Uemura, T. Nagasako, J. Yotani, T. Shimojo and Y. Saito, SID ’98 Digest (1998) 1052.

    Article  Google Scholar 

  3. W. B. Choi, D. S. Chung, S. H. Park and J. M. Kim, SID ’99 Digest (1999) 1134.

    Article  Google Scholar 

  4. Y. Saito, K. Hata and T. Murata, Jpn. J. Appl. Phys. 39 (2000) L271.

    Article  CAS  Google Scholar 

  5. K. A. Dean and B. R. Chalamla, Appl. Phys. Lett. 76 (2000) 375.

    Article  CAS  Google Scholar 

  6. Y. Saito, R. Mizushima, S. Kondo and M. Maida, Jpn. J. Appl. Phys. 39 (2000) 1468.

    Article  Google Scholar 

  7. H. Ibach, “Electron Energy Loss Spectrometers”, ( Springer-Verlag, Berlin, 1991 ).

    Google Scholar 

  8. T. Nagao, K. Kitamura, T. Iizuka, M. Umeuchi, T. Shimazaki, C. Oshima and S. Otani, Surf. Sci. 287 /288 (1993) 391.

    Article  Google Scholar 

  9. T. Nagao, K. Kitamura, T. Iizuka, M. Umeuchi, T. Shimazaki, C. Oshima and S. Otani, Ibid. 290 (1993) 436.

    CAS  Google Scholar 

  10. R. Tamura and M. Tsukada, Phys. Rev. B 52 (1995) 6015.

    Article  CAS  Google Scholar 

  11. Y. Saito, K. Hamaguchi, T. Nishino, K. Hata, K. Tohji, A. Kasuya and Y. Nishina, Jpn. J. Appl. Phys. 36 (1997) L1340.

    Article  Google Scholar 

  12. Y. Saito and S. Uemura, Carbon 38 (2000) 169.

    Article  CAS  Google Scholar 

  13. S. Yamamoto, S. Hosoki, S. Fukuhara and M. Futamoto, Surf. Sci. 86 (1979) 734.

    CAS  Google Scholar 

  14. V. T. Binh, S. T. Purcell, N. Garcia and J. Doglioni, Phys. Rev. Lett. 69 (1992) 2527.

    Article  Google Scholar 

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© 2002 Kluwer Academic Publishers

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Saito, Y., Hata, K., Takakura, A., Matsuda, K., Kona, T., Ohshima, C. (2002). Field Emission Microscopy of Carbon Nanotubes. In: Ōsawa, E. (eds) Perspectives of Fullerene Nanotechnology. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-9598-3_5

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  • DOI: https://doi.org/10.1007/978-94-010-9598-3_5

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-9600-3

  • Online ISBN: 978-94-010-9598-3

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