Abstract
A φ(ρz)-model, well known for its high accuracy, is employed for determining the detection efficiency of a Si(Li) detector by EPMA. Problems and advantages of this approach are pointed out and possible errors in the resulting thicknesses of the beryllium window, the silicon dead layer, the gold contact layer and the ice build-up on the detector surface are estimated. Furthermore the method allows the calculation of the cross section for L 3 subshell ionization to be made with high reliability.
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Röhrbacher, K., Andrae, M., Völkerer, M., Wernisch, J. (1998). Efficiency Calibration of a Si(Li) Detector by EPMA. In: Love, G., Nicholson, W.A.P., Armigliato, A. (eds) Modern Developments and Applications in Microbeam Analysis. Mikrochimica Acta Supplement, vol 15. Springer, Vienna. https://doi.org/10.1007/978-3-7091-7506-4_3
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DOI: https://doi.org/10.1007/978-3-7091-7506-4_3
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