Abstract
As was indicated in Chapt. II, c, it is possible in principle to determine the optical constants n and ϰ of materials as a function of λ from regular reflection measurements, i.e. absorption spectra can be obtained. Two measurements are always necessary, e.g., R ⊥ at two different angles of incidence or R reg(α=0) and the phase shift δ, and tedious mathematical or graphical processes are then needed for the evaluation of n and ϰ. The accuracy of the values obtained in this way is not very satisfactory. This is even true for metals, which have very large -values (Table 2). For most substances, especially organic materials, the ϰ-values are considerably smaller even in the IR region, and the refractive indices lie between 1 and 2. Only when ϰ > 0.2 can reliable ϰ-values be obtained in this way from such reflection measurements. This has been shown by Fahrenfort 391. When ϰ = 0.2, which already corresponds to very high extinction coefficients (cf. note 14 on p. 21), optical constants of most substances cannot be obtained by this method.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Fahrenfort, J.: Spectrochim. Acta 17, 698 (1961).
Harrick, N. J.: Ann. N. Y. Acad. Sci. 101, 928 (1963).
According to Fahrenfort, J.: 1.c.
Fahrenfort, J., and W. M. Visser: Spectrochim. Acta 18, 1103 (1962).
Hansen, W. N.: Spectrochim. Acta 21, 209, 815 (1965).
Fahrenfort, J., and W. M. Visser: Spectrochim. Acta 21, 1433 (1965).
Further measurements for determining the optical constants n and ϰ can be found, for example in Clifford, A. A., and B. Crawford Jr.: J. Phys. Chem. 70, 1536 (1966).
Gilby, A., et al.: J. Phys. Chem. 70, 1525 (1966).
Hansen, W. N.: Spectrochim. Acta 21, 209 (1965);
Hansen, W. N.: ISA Trans. 4, 263 (1965);
Hansen, W. N.: Anal. Chem. 37, 1142 (1965).
Harrick, N. J.: J. Opt. Soc. Am. 49, 376 (1959).
Hansen, W. N.: ISA Trans. 5, 263 (1965).
Harrick, N. J.: Internal reflection spectroscopy. New York: Interscience Publ. 1967;
see also Wendlandt, W. W. (Ed.): Modern aspects of reflectance spectroscopy. New York: Plenum Press 1968.
According to Fahrenfort, J.: 1.c.
Harrick, N. J.: J. Opt. Soc. Am. 55, 851 (1965).
Harrick, N. J.: Ann. N. Y. Acad. Sci. 101, 928 (1963).
Harrick, N. J., and F. K. du Pré: Appl. Opt. 5, 1739 (1966).
Harrick, N. J., and F. K. du Pré: Appl. Opt. 5, 1739 (1966).
The question of whether the band positions measured in transmission or by means of internal reflection correspond to the true frequency of the oscillator has been discussed by Clifford, A. A., and B. Crawford Jr.: J. Phys. Chem. 70, 1536 (1966),
as well as by Young, E. F., and R. W. Hannah: Modern aspects of reflectance spectroscopy, p. 218ff. New York: Plenum Press 1968. The latter authors point out that also in transmission measurements the band positions can be influenced by the materials in the sample holder windows.
Fahrenfort, J.: Spectrochim. Acta 17, 698 (1961).
Harrick, N. J.: Anal. Chem. 36, 188 (1964).
See, for example, Hansen, W. N., and J. A. Horton: Anal. Chem. 36, 783 (1964).
Hansen, W. N.: Anal. Chem. 35, 765 (1963). See also the monograph by Harrick, N. J., cited on p. 313. 21 Kortiim, Reflectance Spectroscopy
Harrick, N. J.: Phys. Rev. Letters 4, 224 (1960);
Harrick, N. J.: Anal. Chem. 36, 188 (1964).
Harrick, N. J.: 1.c. — Hirschfeld, T.: Appl. Opt. 6, 715 (1967).
Compare Kortüm, G.: Kolorimetrie, Photometrie und Spektrometrie, 4th ed., p. 80, 117. Berlin-Göttingen-Heidelberg: Springer 1962.
Harrick, N. J.: Internal reflection spectroscopy. New York: Interscience Publ. 1967.
Berz, F.: Brit. J. Appl. Phys. 16, 1733 (1965).
Harrick, N. J, et al.: J. Opt. Soc. Am. 56, 553 A (1966).
McCarthy, K. A., et al.: Am. Inst. of Physics Handbook, 2nd ed. New York: McGraw-Hill 1963.
McCarthy, K. A., et al.: Landolt-Börnstein: 6th ed., Vol. 1, p. 4. Berlin-Göttingen-Heidelberg: Springer 1955.
Wolfe, W. L., et al.: Am. Inst. of Physics Handbook, 2nd ed. New York: MacGraw-Hill 1963.
Wolfe, W. L., et al.: Landolt-Börnstein: 6th ed., Vol. 8, p. 2. Berlin-Göttingen-Heidelberg: Springer 1962.
For more particulars see Harrick, N. J.: Internal reflection spectroscopy. New York: Interscience Publ. 1967.
Kortüm, G.: Kolorimetrie, Photometrie und Spektrometrie, 4th ed. Berlin-Göttingen-Heidelberg: Springer 1962.
Shurcliff, W. A.: Polarized light. Cambridge, Mass.: Harvard Univ. Press 1962.
Fahrenfort, J., and W. M. Visser: Spectrochim. Acta 18, 1103 (1962).
Gilby, A. C., et al: J. Phys. Chem. 70, 1520, 1525 (1966).
For example: Barnes Engineering, Stamford, Conn. ; Beckman Instruments, Fullerton, Calif.; Perkin-Elmer Corp., Norwalk, Conn.; Research and Industrial Instrument Co., London; Wilks Scientific Corp., South Norwalk, Conn.
Harrick, N. J.: AppL. Opt. 4, 1664 (1965);
Harrick, N. J.: Anal. Chem. 36, 188 (1964).
Becker, G. E., and G. W. Gobeli: J. Chem. Phys. 38, 2942 (1963).
Compare, in this regard, Kortiim, G.: Kolorimetrie, Photometrie und Spektrometrie, 4th ed. Berlin-Göttingen-Heidelberg: Springer 1962.
Fahrenfort, J.: Spectrochim. Acta 17, 698 (1961).
Compare Lyon, R. J. P.: Infrared analysis. New York: Encycl. Earth Sci. 1967.
Harrick, N.J., and B. H. Riederman: Spectrochim. Acta 21, 2135 (1965).
Flournoy, P. A., and W. J. Schaffers: Spectrochim. Acta 22, 5, 15 (1966).
Fraser, R. D. B.: J. chem. Phys. 21, 1511 (1953);
Fraser, R. D. B.: J. chem. Phys. 24, 89 (1956).
Hansen, W. N.: Modern aspects of reflectance spectroscopy, p. 182 ff. New York: Plenum Press 1968.
Compare Harrick, N. J.: Phys. Rev. 125, 1165 (1962).
Beckmann, K. H.: Angew. Chem. 80, 213 (1968).
Wilks, P.A.: Modern aspects of reflectance spectroscopy, p. 192 ff. New York: Plenum Press 1968.
Hansen, W. N.: Anal. Chem. 37, 1142 (1965).
Hansen, W. N.: Spectrochim. Acta 21, 815 (1965).
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1969 Springer-Verlag Berlin-Heidelberg
About this chapter
Cite this chapter
Kortüm, G. (1969). Reflectance Spectra Obtained by Attenuated Total Reflection. In: Reflectance Spectroscopy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-88071-1_8
Download citation
DOI: https://doi.org/10.1007/978-3-642-88071-1_8
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-88073-5
Online ISBN: 978-3-642-88071-1
eBook Packages: Springer Book Archive