Abstract
Quantitative determination of the kinetics of low- temperature oxidation or of other reactions forming thin tarnishing layers on metal surfaces is a challenge for the investigator. The total amount of gas absorbed is less than 100 monolayer equivalents of gas molecules or 1014 to 1017 atoms per cm2. This corresponds to 10-8 to l0-6g/cm2 or 10-5 to 10-3cm3 gas per cm2 at 1 bar and 300 K. Thus, the sensitivity of methods for the determination of rate and time laws should be better than 10-8g/cm2 or 10-5 Ncm3 /cm2. Only hydrogen is absorbed in larger quantities due to its high mobility in the bulk. However, this reaction is normally suppressed or impeded by the oxide scale present on the surface. Therefore, reliable data can be measured only if the surface of the metal sample is not covered by poisoning elements from the beginning to the end of an experiment. Furthermore, varying the parameters pressure and sample temperature within reasonable limits should be possible. Unfortunately, no method enables the determination of low-temperature reaction kinetics in the same ideal manner as microbalance experiments do it in the field of high-temperature oxidation. Each one of the limited number of techniques applied so far has its specific advantages but also severe shortcomings. This chapter gives a short characterization of various experimental methods and their applicability to quantitative measurements will be discussed. The techniques are subdivided into the categories: volumetry, gravimetry, optics, high energy ion beams, X-rays, and surface analytical methods.
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References
H. Lüth: Surfaces and Interfaces of Solid Materials 3rd edn. (Springer, Berlin, Heidelberg 1995).
S. Wagener: Brit. J. Appl. Phys. 1, 255 (1950).
E. Fromm H.G. Wulz: J. Less-common Met. 101, 469–479, (1984).
H. H. Uchida H. G. Wulz E. Fromm: J. Less-common Met. 172–174, 1076–1083, (1991).
E. Fromm H.H. Uchida: J. Less-common Met. 131, 1–12, (1987).
G. Z. Sauerbrey: Zeitschrift für Physik 155, 206 (1959).
C. Lu A. W. Czanderna(eds): Application of Piezoelectric Quartz Crystal Microbalances (ElsevierAmsterdam 1982).
M. Martin E. Fromm: Thin Solid Films 236, 199–203 (1993).
R. M. A. Azzam N. M. Bashara: Ellipsometry and Polarized Light (North Holland, Amsterdam, 1977).
J. A. Woollam P. G. Snyder:Variable angle spectroscopic ellipsometry, in Encyclopedia of Materials Characterization, ed. by C. R. Brundle, C. A. Evans Jr., S. Wilson (Manning Publ., Greenwich, CT 1992).
J.A. Woollam J. Hale H.W. Yao: In-situ and ex-situ applications of spectroscopic ellipsometry, in Diagnostic Techniques for Semiconductor Materials Processing, ed. by O. J. Glemboeki, MRS Proc. 324, 15 (MRS Pittsbourgh, PA 1994).
E. A. Irene J. A. Woollam: In-situ Ellipsometry in Microelectronics, Materials Research Bulletin 20, 24 (1995).
J.N. Hilfiker D.W. Glenn S. Heckens J.A. Woollam: J.Appl. Phys. 79, 6193 (1996)
P. G. Snyder, A. MassengaleK. Memarzadeh, J. A. WoollamD. C. IngramP. P. Pronko: Study of ion implanted copper laser mirrors by spectroscopic ellipsometry, in Beam-Solid Interactions and Transient Processes, ed. by M. O.Thomson, S. T. Picraux, J. S. Williams MRS Proc. 74, 535 (MRS, Pittsbourgh, PA 1987).
C. M. Herzinger, P. G. Snyder, F. G. Celii, Y. C. Kao, D. Chow, B. Johs, J. A. Woollam: J. Appl. Phys. 79, 2663 (1996).
A. C. Boccara, C. Pickering, J. Rivory (eds.): Spectroscopic Ellipsometry, Proc. First Intern. Conf. on Spectroscopic Ellipsometry (Elsevier, Amsterdam 1993).
J. W. Mayer E. Rimini(eds.): Ion Beam Handbook for Material Analysis (Academic, New York 1977).
J. R.Tesmer, M. Nastasi (eds.): Handbook of Modern Ion Beam Materials Analysis (Materials Research Society, Pittsburgh, PA 1995).
B. K. Patnaik, C. V.BarrosLeiteG. B.BaptistaE. A.SchweikertD. L. CockeL.QuinonesN.Magnussen: Nucl. Instr. Methods B35, 159 (1988).
W.K. Chu J.W. Mayer M.A. Nicolet: Backscattering Spectrometry,(Academic,New York 1978)
Th. Enders M. Rilli H. D. Carstanjen: Nucl. Instr. Methods B64, 817 (1992).
D. D. Cohen E. K. Rose: Nucl. Instr. Methods B66, 158 (1992).
G. Dollinger T. Faestermann P. Maier-Komor: Nucl. Instr. Methods B64, 422 (1992).
R. Plieninger, H. D. Carstanjen: Nucl. Instr. Methods, B125, 128–132 (1997).
J. Jamecsny D. Plachke H. Carstanjen: In Proc. Int’l Conf. On Microscopy of Oxidation III, ed. by S. B.NewcombJ. A.Little (Inst. Materials, London, UK 1997) pp. 369–381.
O. Kruse H. D. Carstanjen: Nucl. Instr. Methods B89, 191 (1994).
H. D. Carstanjen, W. Decker, J.DiehlTh.Enders, R.M. Emrick, A. Föhl, E. Friedland, D. Plachke, H. Stoll: Nucl. Instr. Methods B51, 152 (1990).
Th. Osipowicz K. P. Lieb S. Bmssmann: Nucl. Instr. Methods B18, 232 (1987).
T.P. Russell: Mat. Sci. Rep. 5, 171 (1990).
G. P. Felcher H. You(eds.): Proc. 4th Intern. Conf. on Surface X-ray and Neutron Scattering SXNS-4. Physica B 221 (1996).
F. Stangleier B. Lengeier W. Weber H Göbel M. Schuster: Acta Cryst. A 48, 626 (1992).
A. Stierle, T. Mühge, H. Zabel: J. Mater. Res. 9, 884 (1994).
A.Stierle P. Bödeker H. Zabel: Surf. Sci. 327, 9 (1995).
A. Plech U. Klemradt T.H. Metzger, J.Peisl: J. Phys: Condens. Matter 10 971–982 (1998).
D. J O’Connor B. A. Sexton R. St. C. Smart(eds): Surface Analysis Methods in Materials Science, Springer Sen Surf. Sci., Vol 23 (Springer, Berlin, Heidelberg 1992).
G. A. Someijai: Introduction to Surface Chemistry and Catalysis, (Wiley, New York 1994).
M. A. VanHove, W. H. WeinbergC. M. Chan: Low-Energy Electron Diffraction, Springer Ser. Surf. Sci., Vol 6 (Springer, Berlin, Heidelberg 1986).
H. J. Giintherodt R. Wiesendanger(eds.): Scanning Tunneling Microscopy I, 2nd edn., Springer Ser. Surf. Sci., Vol 20 (Springer, Berlin, Heidelberg 1994).
R. Wiesendanger H. J. Giintherodt(eds.): Scanning Tunneling Microscopy II, 2nd edn., Springer Ser. Surf. Sci., Vol 28 (Springer, Berlin, Heidelberg 1995).
C. Bai: Scanning Tunneling Microscopy and ist Application, Springer Ser. Surf. Sci., Vol 32 (Springer, Berlin, Heidelberg 1995).
S. Hufner: Photoelectron Spectroscopy, 2nd edn., Springer Ser. Solid-State Sci., Vol. 82 (Springer, Berlin, Heidelberg 1996).
L. Reimer: Scanning Electron Microscopy, 2nd edn., Springer Ser. Opt. Sci., Vol. 45 (Springer, Berlin, Heidelberg 1998).
L. Reimer: Transmission Electron Microscopy, 4th edn., Springer Ser. Opt. Sci., Vol. 36 (Springer, Berlin, Heidelberg 1997).
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Fromm, E. (1998). Experimental Techniques. In: Kinetics of Metal-Gas Interactions at Low Temperatures. Springer Series in Surface Sciences, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-60311-2_3
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DOI: https://doi.org/10.1007/978-3-642-60311-2_3
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