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Pattern Recognition Approach to Fault Diagnostics

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Fault Diagnosis

Abstract

Any parametric description of a diagnosed object includes only a small part of all existing state parameters; in fact, it is only a simplified model of reality. The best description is that which is in equivalent relation to the given states of the object. It means that the value x(p) of a given physical quantity from the set X occurs if and only if the object is in the state m. In the case of real objects, it is often impossible to establish unambiguously these relations because the physical processes considered are not known adequately in their analytical form, or the parameter calculation is too complex computationally. It follows that fault diagnosis demands determining the relations existing between the measured symptoms (changes of the observed quantity over its face value) and the faults (Calado et al., 2001; Frank and Koppen-Seliger, 1997; Isermann and Balle, 1997).

The work was supported by the EU’s FP5 RTN Development and Application of Methods for Actuators Diagnosis in Industrial Control Systems, DAMADICS (2000–2003).

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References

  • Alippi C. and Piuri V. (1996): Neural methodology for prediction and identification of non-linear dynamic systems. — Proc. Int. Workshop Neural Networks for Identification, Control, Robotics, and Signal/Image Processing, Los Alamitos, California: IEEE Computer Society Press, pp. 305–313.

    Google Scholar 

  • Blum A. and Rivest R.L. (1988): Training a 3-node neural network is NP-complete. — Proc. Workshop Computational Learning Theory, San Francisco, CA, Morgan Kaufmann, pp. 9–18.

    Google Scholar 

  • Calado J.M.F., Korbicz J., Patan K., Patton R.J. and Sá da Costa J.M.G. (2001): Soft computing approaches to fault diagnosis for dynamic systems. — European Journal of Control., Vol. 7, pp. 248–286.

    Article  Google Scholar 

  • Dietterich T.G. (2000): Ensemble methods in machine learning. — Proc. 1st Int. Workshop Multiple Classifier Systems, Lecture Notes in Computer Science (J. Kittler and F. Roli, Eds.), New York: Springer Verlag, pp. 1–15.

    Google Scholar 

  • Duda R.O. and Hart P.E. (1973): Pattern Classification and Scene Analysis. London: John Wiley & Sons.

    MATH  Google Scholar 

  • Eckhardt D.E. and Lee L.D. (1985): A theoretical basis for the analysis of multi-version software subject to coincident errors. — IEEE Trans. Software Engineering, Vol. SE-11, No. 12, pp. 1511–1517.

    Article  Google Scholar 

  • Efron B. (1979): Bootstrap methods: Another look at the jackknife. — The Annals of Statistics, Vol. 7, No. 1, pp. 1–26.

    Article  MathSciNet  MATH  Google Scholar 

  • Ficola A., La Cava M. and Magnino F. (1997): An approach to fault diagnosis for non linear dynamic systems using neural networks. — Proc. 3rd Symp. Fault Detection, Supervision and Safety for Technical Processes, SAFEPROCESS, Hull, England, Vol. 1, pp. 365–370.

    Google Scholar 

  • Filippi E., Costa M. and Pasero E. (1994): Multi-layer perceptron ensembles for increased performance and fault-tolerance in pattern recognition tasks. — Proc. IEEE World Congress Computational Intelligence, Orlando, USA, Vol. 5, pp. 2901–2906.

    Google Scholar 

  • Frank P. and Koppen-Seliger B. (1997): New developments using AI in fault diagnosis. — Engineering Application AI, Vol. 10, No. 1, pp. 3–14.

    Google Scholar 

  • Fukunaga K. (1990): Introduction to Statistical Pattern Recognition. — San Diego: Academic Press, Inc.

    MATH  Google Scholar 

  • Isermann R. and Balle P. (1997): Trends in application of model-based fault detection and diagnosis of technical processes. — Control Eng. Practice, Vol. 5, No. 5, pp. 709–719.

    Article  Google Scholar 

  • Jutten C. (Ed.) (1995): Enhanced learning for evolutive neural architecture. — Technical Report, ESPRIT Basic Research Project Number 6891, available at: http://www.dice.ucl.ac.be/neural-nets/Research/Projects/ELENA/elena.htm

    Google Scholar 

  • Kittler J. (1986): Feature selection and extraction, In: Handbook of Pattern Recognition and Image Processing (T.Y. Young and K.S. Fu, Eds.). — Orlando: Academic Press Inc., pp. 60–84.

    Google Scholar 

  • Knight J. and Leveson N. (1986): An experimental evaluation of independence in multiversion programming. — IEEE Trans. Software Engineering, Vol. SE-12, No. 1, pp. 96–109.

    Article  Google Scholar 

  • Krantz S.G. (1999): Handbook of Complex Analysis — Boston: MA: Birkhäuser.

    Google Scholar 

  • Krogh A. and Vedelsby J. (1995): Neural network ensembles, cross validation and active learning, In: Advances in Neural Information Processing Systems (G. Tesauro, D. Touretzky and T. Leen, Eds.). — Massachusets: MIT Press, pp. 231–238.

    Google Scholar 

  • Leonhardt S. and Ayoubi M. (1997): Methods of fault diagnosis. — Control Eng. Practice, Vol. 5, No. 5, pp. 683–692.

    Article  Google Scholar 

  • Littlewood B. and Miller D. (1989): Conceptual modeling of coincident failures in multiversion software. — IEEE Trans. Software Engineering, Vol. 15, No. 12, pp. 1596–1614.

    Article  MathSciNet  Google Scholar 

  • Looney C.G. (1997): Pattern Recognition Using Neural Networks. — New York: Oxford University Press.

    Google Scholar 

  • Marciniak A. (2000): Fuzzy approach to combining parallel experts response, In: Advances in Soft Computing. Fuzzy Control: Theory and Practice (R. Hampel, M. Wagenknecht and N. Chaker, Eds.). — Heidelberg: Physica-Verlag, pp. 354–360.

    Google Scholar 

  • Martin D. (1983): Dissimilar software in high integrity applications in flight controls. — Proc. Conf. Software for Avionics, AGARD, pp. 36–1–36–9.

    Google Scholar 

  • Rojas R. (1996): Neural Networks. A Systematic Introduction. — Berlin: Springer-Verlag.

    MATH  Google Scholar 

  • Sharkey A. (Ed.) (1999): Combining Artificial Neural Nets: Ensemble and Modular Multi-Net Systems. — Berlin: Springer-Verlag.

    MATH  Google Scholar 

  • Shiavi R.G. and Bourne J.R. (1986): Methods of Biological Signal Processing, In: Handbook of Pattern Recognition and Image Processing (T.Y. Young and K.S. Fu, Eds.) — Orlando: Academic Press Inc., pp. 545–568.

    Google Scholar 

  • Xu L., Krzyzak A. and Suen C.Y. (1992): Methods of combining multiple classsifiers and their applications to hanwriting recognition. — IEEE Trans. Systems, Man, Cybernetics, Vol. 22, No. 3, pp. 418–435.

    Article  Google Scholar 

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Marciniak, A., Korbicz, J. (2004). Pattern Recognition Approach to Fault Diagnostics. In: Korbicz, J., Kowalczuk, Z., Kościelny, J.M., Cholewa, W. (eds) Fault Diagnosis. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-18615-8_14

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  • DOI: https://doi.org/10.1007/978-3-642-18615-8_14

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-62199-4

  • Online ISBN: 978-3-642-18615-8

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