Abstract
The projection of fixed patterns in active 3d measurement systems is deteriorated by ambient lighting. Moreover classic projection patterns lead to ambiguities during pattern detection in the digital signal processing phase. Therefore a dynamic, diffraction based pattern projection system is introduced which can adapt to ambient lighting conditions. For error-free laser pattern detection a method for the design of unambiguous projection patterns is presented.
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Lubeley, D. (2007). Unambiguous Dynamic Diffraction Patterns for 3D Depth Profile Measurement. In: Hamprecht, F.A., Schnörr, C., Jähne, B. (eds) Pattern Recognition. DAGM 2007. Lecture Notes in Computer Science, vol 4713. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74936-3_5
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DOI: https://doi.org/10.1007/978-3-540-74936-3_5
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-74933-2
Online ISBN: 978-3-540-74936-3
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