Abstract
Apertureless probes made of metal, dielectrics, and semiconductors were investigated for use in near-field scanning optical microscopy (NSOM) [1-5]. In the configuration, the electric field localized near the tip of the sample is scattered by the fine structure of the sample or the tip and is detected with external collection optics. From the viewpoint of electromagnetism, the intensity of the scattered field detected in the far-field changes on a nano-metric scale as the boundary conditions of the electromagnetic field vary on a nanometric-scale while scanning the tip or sample of a fine structure with nanometric resolution. Apertureless probes have the following advantages compared to probes with small apertures:
-
1
Since a probe does not have an aperture or opaque coating surrounding the aperture but just the scattering point at the apex, the resolution of an apertureless-probe NSOM can be much higher and can reach a few nanometers.
-
2
Since the metal-coated dielectric waveguide is not used for sending (or receiving) photons to (or from) the probe apex, large optical throughput can be gained without any loss in waveguide propagation near the apex where the diameter of the dielectric is much shorter than the wavelength.
-
3
By using metal as a probe material, field enhancement is anticipated with the local mode of the surface plasmon-polariton at the apex of the probe [6].
-
4
The spectral response of near-field detection with a metallic tip ranges from ultraviolet to infrared because of the use of external optics (e.g., a Cassegrain objective mirror or a lens using an appropriate material), whereas the spectral response of an apertured probe is limited by the component material of the waveguide. The scattering efficiency of a metal is higher in the infrared region than in the visible, then the use of a metallic probe tip can be beneficial in infrared microspectroscopy [5,7].
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
J. M. Vigoureux, C. Girard. and D. C.urjon: General principles of scanning tunneling optical microscopy. Opt. Lett., 14, 1039 (1989)
N. F. van Hulst, M. H. P. Moers, O. F. J. Noordman, R. G. Tack, F. B. Segerink, B. and Böiger: Appl. Phys. Lett. 62, 461 (1993)
Y. Inouye and S. Kawata: Optics Lett. 19, 159 (1994)
R. Zenhausern, M. P. O’Boyle. and H. K. Wickramasinghe: Appl. Phys. Lett. 65. 1623 (1994)
A. Lahrech, P. Bachelot, P. Gleyzes, and A. C. Boccara: Opt. Lett. 21, 1315 (1996)
J. Wessel: J. Opt. Soc. Am. B 2, 1538 (1985)
B. Knoll and F. Keilmann: Nature 399, 134 (1999)
G. Mie: Beiträge zur Optik trüber Medien, speziell kolloidaler Metallösungen. Ann. d. Phys. 25, 377 (1908)
M. Kerker: The Scattering of Light and other Electromagnetic Radiation ( Academic Press, New York 1969 ) pp. 84–88
J. A. Stratton: Electromagnetic Theory ( McGraw-Hill, New York 1941 )
C. F. Bohren and D. R. Huffman: Absorption and Scattering of Light by Small Particles ( John Wiley and Sons, New York 1983 )
H. Fröhlich: Theory of Dielectrics ( Oxford University Press, London 1949 )
B. J. Messinger, K. U. Rayon, R. K. Chang, and P. W. Barber: Phys. Rev. B 24, 649 (1981)
P. K. Aravind and H. Metiu: Surf. Sci. 124, 506 (1983)
M. M. Wind, J. Vlieger, and D. Bedeaux: Physica 141A, 33 (1987)
T. Okamoto and I. Yamaguchi: Opt. Rev. 6, 211 (1999)
T. Okamoto, I. Yamaguchi, and T. Kobayashi: Opt. Lett. 25, 372 (2000)
A. Doron, E. Katz, and I. Willner: 11, 1313 (1995)
R. G. Freeman, K. C. Grabar, K. J. Allison, R. M. Bright, J. A. Davis, A. P. Guthrie, M. B. Hommer, M. A. Jackson, P. C. Smith, D. G. Walter, and M. J. Natan: Science 267, 1629 (1995)
K. C. Grabar, P. C. Smith, M. D. Musick, J. A. Davis, D. G. Walter, M. A. Jackson, A. P. Guthrie, and M. J. Natan: J. Am. Chem. Soc. 118, 1148 (1996)
G. Schmid, S. Peschel, and T. Sawitowski: Z. anorg. allg. Chem. 623, 719 (1997)
T. Sato, D. G. Hasko. and H. Ahmed: J. Vac. Sci. Technol. B 15, 45 (1997)
S. S. Yee (ed.): special issue on Surface Plasmon Resonance (SPR) Optical Sensors, Current Technology and Applications, Sensors and Actuators B 54(12) (1999)
T. Okamoto and I. Yamaguchi: Jpn. J. Appl. Phys. 36, L166 (1997)
W. A. Ducker, T. J. Senden, and R. M. Pashley: Nature 353, 239 (1991)
W. A. Ducker, T. J. Senden, and R. M. Pashley: Langmuir 8, 1831 (1992)
S. Kawata and Y. Inouye: Ultramicroscopy 57, 313 (1995)
F. Zenhausen, Y. Martin, and H. K. Wickramasinghe: Science
F. Möllers, H. J. Tolle, and R. Memming: J. Electrochem. Soc. 121, 1160 (1974)
A. Ashkin, J. M. Dziedzic, J. E. Bjorkholm, and S. Chu: Opt. Lett. 11. 288 (1986)
A. Ashkin, J. Dziedzic, and T. Yamane: Nature, 330, 769 (1987)
K. Svoboda, S. M. Block: Opt. Lett. 19, 930 (1994)
T. Sugiura, T. Okada, Y. Inouye, O. Nakamura, and S. Kawata: Opt. Lett.
T. Sugiura and T. Okada: Proc. SPIE, 3260, 4 (1998)
T. Sugiura. S. Kawata, and T. Okada: J. Microsc. 194, 291 (1999)
S. Kawata. Y. Inouye, and T. Sugiura: Jpn. J. Appl. Phys. 33, L1725 (1994)
K. Sasaki, Z. Shi, R. Kopelman. and H. Masuhara: Chem. Lett. 1996. 141 (1996)
H. Furukawa and S. Kawata: Opt. Comm. 148. 221 (1998)
K. S. Yee: IEEE Trans. Antennas Propagat. AP-14, 302 (1966)
J. B. Judkins and R. W. Ziolkowski: J. Opt. Soc. Am. A 12, 1974 (1995)
D. A. Christensen: Ultramicroscopy 57, 189 (1995)
H. Furukawa and S. Kawata: Opt. Comm. 132, 170 (1996)
L. Novotny, D. W. Pohl, and P. Regli: J. Opt. Soc. Am. A 11, 1768 (1994)
H. Raether: Surface Plasmons on Smooth and Rough Surfaces and on Gratings ( Springer, Berlin Heidelberg New York 1988 )
J. Meixner: IEEE Trans. Antennas Propagation AP-20, 442 (1972)
V. Deckert, D. Zeisel, R. Zenobi, and T. Vo-Dinh: Anal. Chem. 70. 2646 (1998)
N. Hayazawa, Y. Inouye, Z. Sekkat, and S. Kawata: Opt. Commun. 183. 333 (2000)
N. Hayazawa, Y. Inouye, and S. Kawata: J. Microsc. 197, 472 (1999)
R. K. Chang and T. E. Furtak, eds.: Surface Enhanced Raman Scattering ( Plenum, New York 1982 )
N. Hayazawa, Y. Inouye, Z. Sekkat, and S. Kawata: Chem. Phys. Lett. 335, 369 (2001)
A. Otto, I. Mrozek, H. Grabhorn, and W. Akemann: J. Phys. Condens. Matter. 4, 1143 (1992)
P. Kambhampati and A. Campion: Surf. Sci. 427–428, 115 (1999)
U. C. Fischer: J. Vac. Sci. Technol. B3, 386 (1985)
U. C. Fischer and D. W. Pohl: Phys. Rev. Lett. 62, 458 (1989)
U. Durig, D. W. Pohl, and F. Rohner: J. Appl. Phys. 59, 3318 (1986)
S. Jiang, K. Nakagawa, and M. Ohtsu: Jpn. J. Appl. Phys. 33, L55 (1994)
A. Harootunian et al.: Appl. Phys. Lett. 49, 674 (1986)
D. W. Pohl, U. C. Fischer, and U. T. Durig: Proc. SPIE 897, 84 (1988)
R. C. Reddick et al.: Phys. Rev. B39, 767 (1989)
D. Courjon, K. Sarayeddine, and M. Spajer: Opt. Commun. 71, 23 (1989)
S. Jiang et al.: Jpn. J. Appl. Phys. 30, 2107 (1991)
F. de Fornel et al.: Ultramicroscopy 42–44, 422 (1992)
G. Chabrier et al.: Opt. Commun. 107, 347 (1994)
T. Kataoka et al.: Ultramicroscopy 63, 219–225 (1996)
Y. Oshikane et al.: Techn. Dig. 5th Int. Conf. on Near Field Optics, Shirahama, 1998, pp. 12–13
H. Nakagawa et al.: ibid,179–180
R. K. Chang et al.: Optical Processes in Microcavities, Chap. 8 ( World Scientific, New Jersey 1996 )
P. B. Wong et al.: IEEE Trans. Antennas Propagation 44 (4), 504 (1966)
G. Mur: IEEE Trans. Electromagn. Compat. EMC-23(11), 377 (1981)
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2002 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Kawata, S., Inouye, Y., Kataoka, T., Okamoto, T. (2002). Apertureless Near-Field Probes. In: Kawata, S., Ohtsu, M., Irie, M. (eds) Nano-Optics. Springer Series in Optical Sciences, vol 84. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-45273-7_4
Download citation
DOI: https://doi.org/10.1007/978-3-540-45273-7_4
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-07527-8
Online ISBN: 978-3-540-45273-7
eBook Packages: Springer Book Archive