Skip to main content

Abstract

A modern, automatic, sequential x-ray spectrometer collects count data at a rate of 30–100 s per element; semiautomatic and manual instruments are somewhat slower because the settings cannot be made as quickly. A modern, automatic, simultaneous spectrometer collects count data for up to 30 elements in 30–200 s; it has been remarked that simultaneous instruments collect data so fast that the readout time may become significant! An energy-dispersive spectrometer with a multichannel analyzer collects data for up to ~20 elements in 30 s to a few minutes. Clearly, specimen preparation is usually the time-limiting step that determines the sample throughput rate, and when the samples can be measured as received—or substantially so—x-ray spectrochemical analysis is very rapid indeed.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Suggested Reading

  • Bertin, E. P., Principles and Practice of X-Ray Spectrometric Analysis, 2nd ed., Plenum Press, New York (1975); Chaps. 16, 17, and 19, pp. 701–807, 829-858.

    Book  Google Scholar 

  • Bertin, E. P., “Recent Advances in Quantitative X-Ray Spectrometric Analysis by Solution Techniques,” Advan. X-Ray Anal 11, 1–22 (1968).

    Article  Google Scholar 

  • Bertin, E. P., and R. J. Longobucco, “Sample Preparation Methods for X-Ray Fluorescence Emission Spectrometry,” Norelco Rep. 9, 31–43 (1962).

    CAS  Google Scholar 

  • Bertin, E. P., and R. J. Longobucco, “X-Ray Spectrometric Analysis—Nickel, Copper, Silver, and Gold in Plating Baths,” Metal. Finish. 60(3), 54–58 (1962).

    Google Scholar 

  • Campbell, W. J., “Fluorescent X-Ray Spectrographic Analysis of Trace Elements, Including Thin Films,” Amer. Soc. Test. Mater. Spec. Tech. Publ. 349, 48–69 (1964).

    Google Scholar 

  • Chessin, H., and E. H. McLaren, “X-Ray Spectrometric Determination of Atmospheric Aerosols,” Advan. X-Ray Anal. 16, 165–176 (1973).

    Article  CAS  Google Scholar 

  • Claisse, F., “Accurate X-Ray Fluorescence Analysis without Internal Standard,” Que. Prov. Dep. Mines. Prelim. Rep. 327, 24 pp. (1956); Norelco Rep. 4, 3-7, 17, 19, 95-96 (1957).

    Google Scholar 

  • Croke, J. F., and W. R. Kiley, “Specimen-Preparation Techniques;” in Handbook of X-Rays, E. F. Kaelble, ed., McGraw-Hill, New York, Chap. 33, 22 pp. (1967).

    Google Scholar 

  • Cullen, T. J., “Potassium Pyrosulfate Fusion Technique—Determination of Copper in Mattes and Slags by X-Ray Spectroscopy,” Anal. Chem. 32, 516–517 (1960).

    Article  CAS  Google Scholar 

  • Davis, C. M., K. E. Burke, and M. M. Yanak, “X-Ray Spectrographic Analysis of Traces in Metals by Preconcentration Techniques,” Advan. X-Ray Anal. 11, 56–62 (1968).

    Article  Google Scholar 

  • Finnegan, J. J., “Thin-Film X-Ray Spectroscopy,” Advan. X-Ray Anal. 5, 500–511 (1962).

    Article  CAS  Google Scholar 

  • Giauque, R. D., F. S. Goulding, J. M. Jaklevic, and R. H. Pehl, “Trace-Element Determination with Semiconductor-Detector X-Ray Spectrometers,” Anal. Chem. 45, 671–681 (1973) (the “puff” technique).

    Article  CAS  Google Scholar 

  • Green, T. E., S. L. Law, and W. J. Campbell, “Use of Selective Ion-Exchange Paper in X-Ray Spectrography and Neutron Activation—Application to the Determination of Gold,” Anal. Chem. 42, 1749–1753 (1970).

    Article  CAS  Google Scholar 

  • Hirt, R. C., W. R. Doughman, and J. B. Gisclard, “Application of X-Ray Emission Spectrography to Air-Borne Dusts in Industrial Hygiene Studies,” Anal. Chem. 28, 1649–1651 (1956).

    Article  CAS  Google Scholar 

  • Jenkins, R., and J. L. de Vries, Practical X-Ray Spectrometry, 2nd ed., Springer-Verlag New York, New York (1969); Chap. 8, pp. 145–164.

    Book  Google Scholar 

  • Luke, C. L., “Determination of Trace Elements in Inorganic Materials by X-Ray Fluorescence Spectroscopy,” Anal. Chim. Acta 41, 237–250 (1968).

    Article  CAS  Google Scholar 

  • Matocha, C. K., “New Briqueting Technique,” Appl. Spectrosc. 20, 252–253 (1966).

    Article  CAS  Google Scholar 

  • Michaelis, R. E., “Report on Available Standard Samples, Reference Samples, and High-Purity Materials for Spectrochemical Analysis,” Amer. Soc. Test. Mater. Data Ser. DS-2, 156 pp. (1964).

    Google Scholar 

  • Michaelis, R. E., and B. A. Kilday, “Surface Preparation of Solid Metallic Samples for X-Ray Spectrochemical Analysis,” Advan. X-Ray Anal. 5, 405–411 (1962).

    Article  CAS  Google Scholar 

  • Mizuike, A., “Separation and Preconcentration Techniques”; in Modern Analytical Techniques for Metals and Alloys, Part 1, R. F. Bunshah, ed., Techniques of Metals Research Series, vol. 3, part 1; Wiley-Interscience, New York, pp. 25–67 (1970).

    Google Scholar 

  • Mueller, J. I., V. G. Scorn, and J. J. Little, “Fluorescent X-Ray Analysis of Highly Radioactive Samples,” Advan. X-Ray Anal. 2, 157–166 (1959).

    Google Scholar 

  • National Bureau Of Standards (U.S.), “Catalog of Standard Reference Materials,” Nat. Bur. Stand. (U.S.) Spec. Publ. 260, 77 pp. (1970).

    Google Scholar 

  • National Bureau Of Standards (U.S.), “Standard Reference Materials—Sources of Information,” Nat. Bur. Stand. (U.S.) Misc. Publ. 260-4, 18 pp. (1965).

    Google Scholar 

  • Salmon, M. L., “Simple Multielement-Calibration System for Analysis of Minor and Major Elements in Minerals by Fluorescent X-Ray Spectrography,” Advan. X-Ray Anal. 5, 389–404 (1962).

    Article  CAS  Google Scholar 

  • Togel, K., “Preparation Technique for X-Ray Spectrometry”; in Zerstörungsfreie Materialprüfung (“Nondestructive Material Testing”), E. A. W. Muller, ed.; Oldenbourg, Munich, Germany, sec. U152 (1961).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 1978 Springer Science+Business Media New York

About this chapter

Cite this chapter

Bertin, E.P. (1978). Specimen Preparation and Presentation. In: Introduction to X-Ray Spectrometric Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-2204-5_10

Download citation

  • DOI: https://doi.org/10.1007/978-1-4899-2204-5_10

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-306-31091-1

  • Online ISBN: 978-1-4899-2204-5

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics