Abstract
The advent of high-resolution, high-sensitivity charge couple device (CCD) cameras supplied with fast computers and software algorithms has permitted the routine collection and measurement of EBSD patterns for microcharacterization. Modern camera technology is required for easy acquisition of low intensity patterns and fast pattern analysis makes real-time acquisitions possible. Once the pattern is collected and the Kikuchi bands are identified, there are at least two analyses possible: orientation mapping of known crystal(s) and phase identification of unknown crystals. Although both analyses use EBSD patterns, it has been found that both the hardware and software should be optimized for these different tasks. This chapter will discuss the optimizations deemed necessary for optimal EBSD performance.
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© 2000 Springer Science+Business Media New York
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Camus, P.P. (2000). Hardware and Software Optimization for Orientation Mapping and Phase Identification. In: Schwartz, A.J., Kumar, M., Adams, B.L. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3205-4_11
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DOI: https://doi.org/10.1007/978-1-4757-3205-4_11
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-3207-8
Online ISBN: 978-1-4757-3205-4
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