Abstract
In the past three chapters we’ve described the sources, lenses, and detectors that make up a TEM. The only other parts of the instrument you need to know about in detail are the parts that, if you are not careful, can seriously degrade the quality of the information you generate. These two parts are the holder in which you put your specimen and the vacuum that surrounds it. While there isn’t much you can do to improve the vacuum, beyond buying a better microscope, there is a lot you can do that will degrade the quality of the vacuum in the column and, in doing so, contaminate your specimen. So we’ll tell you a few basics about how the vacuum pumps work, and how the vacuum system is put together. Although the vacuum system is under computer control in most TEMs, you still affect the vacuum by what you put in the microscope. Consequently, you need to know what not to do on those occasions that you can degrade the vacuum.
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References
General References
Watt, I.M. (1985) The Principles and Practice of Electron Microscopy, Cambridge University Press, New York. See Appendix 1.
Bigelow, W.C. (1995) Vacuum Methods in Electron Microscopy, in the series Practical Methods in Electron Microscopy, 15 ( Ed. A.M. Glauert), Portland Press, London. An essential reference.
O’Hanlon, J.F. (1980) A User’s Guide to Vacuum Technology, John Wiley and Sons, New York.
Specific References
Butler, E.P. and Hale, K.F. (1981) Dynamic Experiments in the Electron Microscope, in the series Practical Methods in Electron Microscopy, 9 ( Ed. A.M. Glauert), Elsevier, Amsterdam.
Komatsu, M., Mori, H., and Iwasaki, K. (1994) J. Am. Ceram. Soc. 77, 839.
Valdrè, U. and Goringe, M.J. (1971) in Electron Microscopy in Materials Science (Ed. U. Valdrè), p. 208, Academic Press, New York.
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© 1996 Springer Science+Business Media New York
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Williams, D.B., Carter, C.B. (1996). Pumps and Holders. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2519-3_8
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DOI: https://doi.org/10.1007/978-1-4757-2519-3_8
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