Abstract
Internal interfaces (grain boundaries, phase boundaries, stacking faults) or external interfaces (i.e., surfaces) are perhaps the most important defects in crystalline engineering materials. Their common feature is that we can usually think of them as all being two-dimensional, or planar, defects. The main topics of this chapter will be:
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Characterizing which type of internal interface we have and determining its main parameters.
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Identifying lattice translations at these interfaces from the appearance of the diffraction-contrast images.
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Williams, D.B., Carter, C.B. (1996). Planar Defects. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2519-3_24
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DOI: https://doi.org/10.1007/978-1-4757-2519-3_24
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