Abstract
Optical emission spectrometry is a well proven analytical technique, in widespread use for the last 30 to 40 years. However, early devices available as optical emission sources (arc, spark or dc electrical discharges) had a number of disadvantages that prevented their widespread use for fully quantitative analysis of silicate samples. This situation changed dramatically during the mid-1960s with the development of inductively coupled argon plasma as an emission source for spectroscopic measurements.
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Chapter 5
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Potts, P.J. (1987). Inductively coupled plasma—atomic emission spectrometry. In: A Handbook of Silicate Rock Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-3270-5_5
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