Abstract
Among many statistical circuit optimization objectives, yield is of primary importance, because it is closely related to profit. Manufacturing yield is defined as the percentage of the total number of products manufactured that fulfill both functional and parametric performance requirements1.
For more detailed yield definitions, involving different types of yield, e.g., design yield, wafer yield, probe yield, processing yield, etc. see [109].
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© 1995 Springer Science+Business Media New York
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Zhang, J.C., Styblinski, M.A. (1995). Parametric Yield Maximization. In: Yield and Variability Optimization of Integrated Circuits. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2225-6_4
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DOI: https://doi.org/10.1007/978-1-4615-2225-6_4
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