Abstract
The major bottleneck in solving IC statistical optimization problems lies in a large number of designable parameters involved. Factor screening has to be performed before attempting to solve real life IC design problems using statistical optimization techniques.
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© 1995 Springer Science+Business Media New York
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Zhang, J.C., Styblinski, M.A. (1995). Design of Experiments. In: Yield and Variability Optimization of Integrated Circuits. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2225-6_3
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DOI: https://doi.org/10.1007/978-1-4615-2225-6_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-5935-7
Online ISBN: 978-1-4615-2225-6
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