Abstract
Castaing’s first electron probe microanalyzer(l) was a modified electrostatic transmission electron microscope equipped with a curved-crystal x-ray spectrometer. This combination was perfected in later years by the introduction of Langmuir-Blodgett devices(2) and of diffractors consisting of evaporated metal layers, (3) so that the elements of atomic number above 3 could also be observed and analyzed.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
R. Castaing, Doctoral Thesis, University of Paris (1951).
I. Langmuir, J. Franklin Inst. 218, 153 (1934).
J. F. Bastin and H. J. M. Heijligers, in: Electron Probe Quantitation (K. F. J. Heinrich and D. E. Newbury, eds.) Plenum Press, NewYork, p. 145 (1991).
R. Castaing and J. Descamps, J. Phys. Radium 16, 304 (1955).
S. J. B. Reed and J. V. P. Long, NBS Technical Note 521, National Bureau of Standards, Washington, DC, p. 317 (1970).
R. Castaing and J. Descamps, J. Phys. Radium 16, 304 (1955).
R. Castaing and J. Henoc in: Proceedings, Fourth International Congress on X-Ray Optics and Microanalysis (R. Castaing, P. Deschatnp, and J. Philibert, eds.) Hermann, Paris, p. 120 (1966).
J. Philibert, in: Proceedings, Third International Conference on X-Ray Optics and Microanalysis (H. H. Pattee, V. E. Cosslett, and A. Engstrom, eds.) Academic Press, New York, p. 379 (1963).
K. F. J. Heinrich and D. E. Newbury, eds., Electron Probe Quantitation, Plenum Press, New York (1991).
V. E. Cosslet and P. Duncumb, Nature 177, 1172 (1956).
G. F. Bastin and H. J. M. Heijligers, in: Electron Probe Quantitation (K. F. J. Heinrich and D. E. Newbury, eds.) Plenum, New York, p. 163 (1991).
C. J. Cooke and P. Duncumb, in: Proceedings, Fifth International Congress on X-Ray Optics and Microanalysis (G. Möllenstedtand and K. H. Gaukler, eds.) Springer, Berlin, p. 245 (1969).
K. F. J. Heinrich, Advances in X-Ray Analysis 3, Plenum Press, New York, p. 370 (1960).
R. M. Dolby, in: X-Ray Optics and X-Ray Microanalysis (H. H. Pattee, V. E. Cosslett, and A. Engstöm, eds.) Academic Press, New York, p. 483 (1963).
R. Fitzgerald, K. Keil, and K. F. J. Heinrich, Science 159, 528 (1968).
E Duncumb, in: X-Ray Microscopy and Microradiography (V. E. Cosslett, A. Eng-ström, and H. H. Pattee, eds.) Academic Press, New York, p. 617 (1957).
K. F. J. Heinrich, Electron Beam X-Ray Microanalysis, Van Nostrand Reinhold, New York, p. 193 (1981).
Standard Reference Data Base 36, available from the Office of Standard Reference Data, National Institute of Standards and Technology, Gaithersburg, MD 20899.
T. O. Ziebold and R. E. Ogilvie, Anal. Chem. 36, 322 (1964).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1995 Springer Science+Business Media New York
About this chapter
Cite this chapter
Heinrich, K.F.J. (1995). The Development of Energy Dispersive Electron Probe Analysis. In: Williams, D.B., Goldstein, J.I., Newbury, D.E. (eds) X-Ray Spectrometry in Electron Beam Instruments. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-1825-9_1
Download citation
DOI: https://doi.org/10.1007/978-1-4615-1825-9_1
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-5738-4
Online ISBN: 978-1-4615-1825-9
eBook Packages: Springer Book Archive