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Interconnect Issues

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Wafer-Level Integrated Systems

Part of the book series: The Kluwer International Series in Engineering and Computer Science ((SECS,volume 70))

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Abstract

This chapter reviews several system performance limits imposed on electronic digital systems by their electrical interconnection fabric. Relaxing such limits is perhaps the major motivation for WSI, though different WSI projects typically address different interconnection issues.

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Authors and Affiliations

  1. AT&T Bell Laboratories, USA

    Stuart K. Tewksbury

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  1. Stuart K. Tewksbury
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© 1989 Kluwer Academic Publishers

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Tewksbury, S.K. (1989). Interconnect Issues. In: Wafer-Level Integrated Systems. The Kluwer International Series in Engineering and Computer Science, vol 70. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1625-1_2

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  • DOI: https://doi.org/10.1007/978-1-4613-1625-1_2

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-8898-5

  • Online ISBN: 978-1-4613-1625-1

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