Abstract
Studies on the process of anode oxidation for production of copper and lead oxides have been reported in a number of papers1,2,3,4. A major drawback of these methods is a lack of possibility of direct monitoring of the changes in the phase composition during the process of formation of the oxide layers. When removed from the electrolyte and subjected to a treatment such as rinsing and drying, the layer of oxidation products may also undergo structural changes. This situation prompted a decision to study the phase composition of the oxidation products of copper and lead directly during the anode electrocrystallization process. For this purpose a TURM-62 X-ray diffractometer was used with a special attachment as described in ref. 5. The use of this attachment makes it possible to obtain X-ray diffraction pattern during electrocrystallization of the oxide layer.
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References
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E. Łagiewka, A. Budniok, Surface and Coatings Technology 27: 57 (1986).
Universal-Röntgen-Diffraktometer H“ZG 4/C, VEB Freiberger Präzisionsmechanik, Freiberg (1983).
JCPDS Powder Diffraction File, International Centre for Diffraction Data, Swarthmore, Pennsylvania (1977).
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© 1989 Plenum Press, New York
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Łagiewka, E., Budniok, A. (1989). X-Ray Phase Analysis of Cu and Pb Anodic Oxidation Products. In: Hašek, J. (eds) X-Ray and Neutron Structure Analysis in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0767-9_7
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DOI: https://doi.org/10.1007/978-1-4613-0767-9_7
Publisher Name: Springer, Boston, MA
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