Abstract
The inelastic scattering of electrons provides a powerful technique to study the primary processes of electronic excitation and to obtain information on the electronic structure of materials. The energy loss ΔE suffered by an incident electron originally at energy Ep directly defines a fundamental electronic excitation of the target system. Electron energy loss spectroscopy (EELS) of condensed phases may be carried out either in the transmission mode, in which fast electrons (50< Ep <300 keV) pass through thin films (≲ 100 nm) of solids while undergoing mainly bulk excitations, or in reflection mode, in which slower electrons 20 eV ≲ E p ≲ 2 keV suffer both electron loss and elastic backscattering from the surface. Here the effective sampling depth is directly dependent on the primary energy Ep, and both bulk and surface excitations will be present. In the early days of EELS the technique was often called “characteristic electron loss spectroscopy” thereby pointing at the fact that element specific structure was observed in the spectra, whose origin was then still unrevealed.
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Netzer, F.P. (1988). Electron Energy Loss Spectroscopy in Reflection Geometry. In: Ferreira, J.G., Ramos, M.T. (eds) X-Ray Spectroscopy in Atomic and Solid State Physics. NATO ASI Series, vol 187. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0731-0_15
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