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Stereological Interpretation of Measurement Data

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Computer-Assisted Microscopy

Abstract

Stereology is a coined word, in use now for nearly three decades to describe the study of relationships between three-dimensional structure and the measurement parameters that can be obtained from conventional two-dimensional images. Many of the fundamental relationships and principles of stereology come from the mathematical field of geometrical probability which has deep roots (Buffon, 1777), but it is not essential to be comfortable with the derivations of the tools to be able to utilize them. (For comprehensive references to stereological interpretation, see DeHoff & Rhines, 1968; Underwood, 1970; Weibel, 1979; Russ, 1986).

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Authors and Affiliations

  1. North Carolina State University, Raleigh, North Carolina, USA

    John C. Russ

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  1. John C. Russ
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© 1990 Plenum Press, New York

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Russ, J.C. (1990). Stereological Interpretation of Measurement Data. In: Computer-Assisted Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0563-7_8

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  • DOI: https://doi.org/10.1007/978-1-4613-0563-7_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-7868-9

  • Online ISBN: 978-1-4613-0563-7

  • eBook Packages: Springer Book Archive

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