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© 1990 Springer-Verlag Berlin Heidelberg
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(1990). VLSI design test problems. In: A Collection of Test Problems for Constrained Global Optimization Algorithms. Lecture Notes in Computer Science, vol 455. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3540530320_12
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DOI: https://doi.org/10.1007/3540530320_12
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