Abstract
The generation of representative sample data for data warehouses for henchmarking, testing and presentation purposes is a challenging complex task. Difficulties often arise in producing familiar, complete and consistent sample data of any scale. Producing sample data manually often causes problems, which can be avoided by an automatic generation tool producing consistent and statistical plausible data. The data generated by the tool is based on the linear statistical model of a hierarchical n-way classification with fixed effects. We present an approach for a flexible generation of “real world” sample data using the BEDAWA (BEnchmarks forDAta WArehouses) tool.
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© 2000 Springer-Verlag Berlin Heidelberg
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Huynh, T.N., Nguyen, B.T., Schiefer, J., Tjoa, A.M. (2000). BEDAWA - A Tool for Generating Sample Data for Data Warehouses. In: Kambayashi, Y., Mohania, M., Tjoa, A.M. (eds) Data Warehousing and Knowledge Discovery. DaWaK 2000. Lecture Notes in Computer Science, vol 1874. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-44466-1_9
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DOI: https://doi.org/10.1007/3-540-44466-1_9
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