Abstract
A new principle of arranging temperature measurements in integrated temperature probes is suggested that makes it possible to attain a high linearity in a simple way. Circuitry implementation and techniques that allow one to reduce power supply voltage are considered. The experimental results obtained are given.
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V. I. Enns and Yu. M. Kobzev, Design of Analog MOS-Integrated Circuits, Short Manual of Designer (Goryach. Liniya-Telekom, Moscow, 2005).
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Original Russian Text © V.V. Enns, Yu.M. Kobzev, V.I. Enns, 2009, published in Izvestiya vysshikh uchebnykh zavedenii. Elektronika, 2009, Vol. 43, No. 13.
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Enns, V.V., Kobzev, Y.M. & Enns, V.I. A linear temperature probe with a low power supply voltage. Semiconductors 43, 1728–1731 (2009). https://doi.org/10.1134/S1063782609130247
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DOI: https://doi.org/10.1134/S1063782609130247