Abstract
A computer simulation and an experimental study of the frequency dependences of the transmission coefficients of photonic crystals are carried out on the basis of microstrip lines with distortion in their periodicity in the form of change in the microstrip dimensions and the permittivity of a substrate of one of the alternate pieces of the microstrip line in the range of 0–20 GHz. Good quantitative agreement between the results of calculations and experimental data is obtained. It is shown that there is a possibility of using open microwave transmission lines, namely, microstrip photonic structures, to implement a method for measuring the parameters of material samples with the specified geometrical shape and a certain size that perform a function of nonuniformity in the photonic structure.
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Original Russian Text © D.A. Usanov, A.V. Skripal’, A.V. Abramov, A.S. Bogolyubov, M.Yu. Kulikov, 2009, published in Izvestiya vysshikh uchebnykh zavedenii. Elektronika, 2009, Vol. 43, No. 13.
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Usanov, D.A., Skripal’, A.V., Abramov, A.V. et al. Photonic structures and their application for measuring material parameters. Semiconductors 43, 1677–1681 (2009). https://doi.org/10.1134/S1063782609130132
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DOI: https://doi.org/10.1134/S1063782609130132