Abstract
A change in the chemical composition of the CdxHg1−x Te surface as a result of its treatment by atomic beams of oxygen and hydrogen was investigated. The beams were obtained by the electron impact in a high-frequency plasma of N2O and H2 gases. The consecutive action of beams of atomic oxygen and hydrogen was shown to result in the removal of carbon-containing compounds, a layer of native oxide, and tellurium in its elemental state from the surface of samples.
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Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 35, No. 2, 2001, pp. 203–205.
Original Russian Text Copyright © 2001 by Vasil’ev, Zakhar’yash, Kesler, Parm, Solov’ev.
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Vasil’ev, V.V., Zakhar’yash, T.I., Kesler, V.G. et al. Investigation of a change in the chemical composition of the surface of CdxHg1−x Te samples as a result of treatment by N2O and H2 gases activated in a high-frequency discharge. Semiconductors 35, 196–198 (2001). https://doi.org/10.1134/1.1349931
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DOI: https://doi.org/10.1134/1.1349931