Abstract
For the first time, we obtained the photoreflectance spectra in single-layer samples of porous silicon with 13 μm thick in the 550–1000 nm spectral region. To describe the observed reflection and photoreflectance spectra, we use a theory of multiple-beam interference, taking into account the strong absorption of Si in this spectral region. We show that, under the action of a laser radiation with a wavelength 532 nm of 30 mW power and pulse duration 3 ms, the change in the refractive index δn reaches values of the order of 10−5, and this takes place due to the thermal nonlinearity of the refractive index. We show that photoreflectance spectroscopy can be used to measure the thermo-optic coefficients of porous silicon.
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References
L. A. Golovan and V. Y. Timoshenko, J. Nanoelectron. Optoelectron., 8, 223 (2013).
J. Misiewicz, P. Sitarek, G. Sęk, and R. Kudrawiec, Mater. Sci., 21, 263 (2003).
A. Rosencwaig, J. Opsal, W. L. Smith, and D. L. Willenborg, Appl. Phys. Lett., 46, 1013 (1985).
V. S. Gorelik and V. V. Shchavlev, Bull. Lebedev Phys. Inst., 43, 189 (2016).
V. S. Gorelik, M. M. Yashin, D. Bi, and G. T. Fei, Opt. Spectrosc., 124, 167 (2018).
L. Canham, Handbook of Porous Silicon, Springer Verlag, Berlin (2014).
D. Fuertes Marrän, E. Cïnovas, I. Artacho, et al., Mater. Sci. Eng. B, 178, 599 (2013).
H. Shen and M. Dutta, J. Appl. Phys., 78, 2151 (1995).
J. Opsal, M. W. Taylor, W. L. Smith, and A. Rosencwaig, J. Appl. Phys., 61, 240 (1987).
R. E. Wagner and A. Mandelis, J. Phys. Chem. Solids, 52, 1061 (1991).
S. E. Svyakhovskiy, A. I. Maydykovsky, and T. V. Murzina, J. Appl. Phys., 112, 013106 (2012).
L. P. Avakyants, P. Y. Bokov, and A. V Chervyakov, Tech. Phys., 50, 1316 (2005).
R. Tomasiunas, I. Pelant, J. Kočka, et al., J. Appl. Phys., 79, 2481 (1996).
P. Apiratikul, A. M. Rossi, and T. E. Murphy, Opt. Express, 17, 3396 (2009).
M. Dinu, F. Quochi, and H. Garcia, Appl. Phys. Lett., 82, 2954 (2003).
H. K. Tsang, C. S. Wong, T. K. Liang, et al., Appl. Phys. Lett., 80, 416 (2002).
F. X. Alvarez, D. Jou, and A. Sellitto, Appl. Phys. Lett., 97, 033103 (2010).
H. S. Carslaw and J. C. Jaeger, Conduction of Heat in Solids, 2nd ed., Oxford Clarendon Press (1959).
L. Moretti, L. De Stefano, A. Mario Rossi, and I. Rendina, Appl. Phys. Lett., 86, 061107 (2005).
M. A. Green, Sol. Energy Mater. Sol. Cells, 92, 1305 (2008).
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Manuscript submitted by the authors in English on January 27, 2020.
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Avakyants, L.P., Svyakhovskiy, S.E., Aslanyan, A.E. et al. Photoreflectance in Monolayer Mesoporous Silicon Structures. J Russ Laser Res 41, 207–214 (2020). https://doi.org/10.1007/s10946-020-09866-w
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DOI: https://doi.org/10.1007/s10946-020-09866-w