Abstract
High resolution reflective ellipsometry is used to study freely suspended plastic films. We determine room temperature optical constants in the infrared for a variety of plastics using ellipsometry. The films are typically 6 to 100 μm thick and measurements are performed from near infrared to long wave-IR. The setup includes modeling software to fit the ellipsometric data to a generalized oscillator model. The films studied include acrylics, fluoropolymers, and variations of polyethylene, polystyrene, and polyvinyl chloride (PVC) among others. We are able to determine in-plane and out-of-plane optical constants. Transmission spectra from FTIR measurements are plotted and compared with ellipsometry results.
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Folks, W.R., Pandey, S.K., Pribil, G. et al. REFLECTIVE INFRARED ELLIPSOMETRY OF PLASTIC FILMS. Int J Infrared Milli Waves 27, 1553–1571 (2006). https://doi.org/10.1007/s10762-006-9150-3
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DOI: https://doi.org/10.1007/s10762-006-9150-3