Abstract
Sol-gel applications require very thick layers with a good understanding of the interfaces. To address this problem, we have installed at CEA Le Ripault a characterization bench using guided waves with assistance from the IM2NP lab in Marseille. This bench allows us to measure the thickness and the refractive index and determine the extinction coefficient of a thin layer. We can distinguish losses at interfaces from those in the bulk according to the chosen propagation mode. This allows us to know if we can stack elementary layers to make thick layers without incurring problems.
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References
P. Belleville, C. Bonnin, and J.-J. Priotton: J. Sol-Gel Sci. Technol. 19 (2000) 223.
Y. Xu, B. Zhang, W. H. Fan, D. Wu, and Y. H. Sun: Thin Solid Films 440 (2003) 180.
C. Le Luyer, L. Lou, C. Bovier, J. C. Plenet, J. G. Dumas, and J. Mugnier: Opt. Mater. 18 (2001) 211.
F. Flory: in Thin Films for optical System, ed. F. Flory (Marcel Dekker, 1995) p. 393.
Web [http://www.metricon.com/].
R. Ulrich and R. Torge: Appl. Opt. 12 (1973) 2901.
S. Monneret, P. Huguet-Chantôme, and F. Flory: J. Opt. A 2 (2000) 188.
W. Lukosz and P. Pliska: Opt. Commun. 117 (1995) 1.
S. Somaya: in Advances in Ceramics, ed. G. L. Messing et al. (Wersterville, Ohio, 1987) Hydrothermal Processing of Ultrafine Single-Crystal Zirconia and Hafnia Powders with Homogeneous Dopants.
A. E. Ennos: Appl. Opt. 5 (1966) 51.
H. Kozuka, S. Takenaka, H. Tokita, T. Hirano, Y. Higashi, and T. Hamatani: J. Sol-Gel Sci. Technol. 26 (2003) 681.
H. Kozuka, M. Kajimura, T. Hirano, and K. Katayama: J. Sol-Gel Sci. Technol. 19 (2000) 205.
R. Brenier, C. Urlacher, J. Mugnier, and M. Brunel: Thin Solid Films 338 (1999) 136.
S. Palmier, J. Neauport, N. Baclet, E. Lavastre, and G. Dupuy: Opt. Express 17 (2009) 20430.
A. Mehner, W. Datchary, N. Bleil, H.-W. Zoch, M. J. Klopfstein, and D. A. Lucca: J. Sol-Gel Sci. Technol. 36 (2005) 25.
X. Dieudonné, K. Vallé, and P. Belleville: Opt. Express 19 (2011) 16356.
A. Ayouch, X. Dieudonné, G. Vaudel, H. Piombini, K. Vallé, V. Gusev, P. Belleville, and P. Ruello: ACS Nano 6 (2012) 10614.
L. Zhang, Y. Xu, D. Wu, Y. Sun, X. Jiang, and X. Wei: Opt. Laser Technol. 40 (2008) 282.
W. B. Jackson, N. M. Amer, A. C. Boccara, and D. Fournier: Appl. Opt. 20 (1981) 1333.
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Piombini, H., Dieudonne, X., Wood, T. et al. Guided wave measurements for characterization of sol-gel layers. OPT REV 20, 426–432 (2013). https://doi.org/10.1007/s10043-013-0073-7
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DOI: https://doi.org/10.1007/s10043-013-0073-7