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MapReduce Based Parallel Bayesian Network for Manufacturing Quality Control

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Abstract

Increasing complexity of industrial products and manufacturing processes have challenged conventional statistics based quality management approaches in the circumstances of dynamic production. A Bayesian network and big data analytics integrated approach for manufacturing process quality analysis and control is proposed. Based on Hadoop distributed architecture and MapReduce parallel computing model, big volume and variety quality related data generated during the manufacturing process could be dealt with. Artificial intelligent algorithms, including Bayesian network learning, classification and reasoning, are embedded into the Reduce process. Relying on the ability of the Bayesian network in dealing with dynamic and uncertain problem and the parallel computing power of MapReduce, Bayesian network of impact factors on quality are built based on prior probability distribution and modified with posterior probability distribution. A case study on hull segment manufacturing precision management for ship and offshore platform building shows that computing speed accelerates almost directly proportionally to the increase of computing nodes. It is also proved that the proposed model is feasible for locating and reasoning of root causes, forecasting of manufacturing outcome, and intelligent decision for precision problem solving. The integration of bigdata analytics and BN method offers a whole new perspective in manufacturing quality control.

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Authors and Affiliations

  1. School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China

    Mao-Kuan Zheng, Xin-Guo Ming, Xian-Yu Zhang & Guo-Ming Li

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  1. Mao-Kuan Zheng
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  2. Xin-Guo Ming
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Corresponding author

Correspondence to Xin-Guo Ming.

Additional information

Supported by 2015 Special Funds for Intelligent Manufacturing of China MIIT (Grant No. 2015-415), and National Natural Science Foundation of China (Grant No. 71632008).

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Zheng, MK., Ming, XG., Zhang, XY. et al. MapReduce Based Parallel Bayesian Network for Manufacturing Quality Control. Chin. J. Mech. Eng. 30, 1216–1226 (2017). https://doi.org/10.1007/s10033-017-0179-0

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  • DOI: https://doi.org/10.1007/s10033-017-0179-0

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