Abstract.
A time-resolved THz tomography system for the incidence-angle-dependent three-dimensional characterization of layered structures is presented. The capabilities of the developed system are demonstrated on multi-layer ceramic samples used for solid oxide fuel cells (SOFC). Appropriate methods for determining unknown refractive indices are discussed. It is shown how the angle of incidence of a THz imaging system has a significant influence on measured signals. This fact can be exploited especially in Brewster-angle configurations to enhance the capabilities of any THz tomography system. Data evaluation algorithms are presented.
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Received: 8 June 2000 / Revised version: 13 September 2000 / Published online: 10 January 2001
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Brucherseifer, M., Haring Bolivar, P., Klingenberg, H. et al. Angle-dependent THz tomography – characterization of thin ceramic oxide films for fuel cell applications . Appl Phys B 72, 361–366 (2001). https://doi.org/10.1007/s003400100474
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DOI: https://doi.org/10.1007/s003400100474