Abstract
We present an improved Schlieren method to measure the optical quality of crystals, defined by it’s optical homogeneity and the surface roughness of it’s facets. The method is based on a combination of Schlieren, interferometric and tilting angle measurements. It is especially appropriate for the optical characterization of crystals with small clear apertures. The theory and an application of this improved technique on a BIBO crystal are given. Spatial resolution and sensitivity of the method are mainly defined by the Schlieren setup, which offers a spatial resolution as high as 27 μm and a minimum deflection angle as low as 2.3×10-6.
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81.70.Fy; 78.20.Ci; 42.25.Hz
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Wesemann, V., Borsutzky, A., Wallenstein, R. et al. An improved Schlieren method for the sensitive and spatially resolved measurement of the quality of optical crystals with small apertures. Appl. Phys. B 89, 377–383 (2007). https://doi.org/10.1007/s00340-007-2789-1
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DOI: https://doi.org/10.1007/s00340-007-2789-1