Abstract
We use simple transmission line models with lumped elements of inductance and capacitance to interpret optical transmission and reflection spectra of cut wires and cut-wire pairs in the near infrared region. The numerical values of the elements are obtained by fitting experimental or numerical simulated reflectance and transmittance spectra. The scattering parameters and the retrieved effective material parameters calculated from the transmission line models show good agreements with those obtained from experiments or numerical simulations. This indicates that transmission line theory is a powerful tool for designing and analyzing metamaterials at optical frequencies.
Article PDF
Similar content being viewed by others
Avoid common mistakes on your manuscript.
References
V.G. Veselago, Sov. Phys. Uspekhi 10, 509 (1968)
J.B. Pendry, Phys. Rev. Lett. 85, 3966 (2000)
R.A. Shelby, D.R. Smith, S. Schultz, Science 292, 77 (2001)
C. Enkrich, M. Wegener, S. Linden, S. Burger, L. Zschiedrich, F. Schmidt, J.F. Zhou, T. Koschny, C.M. Soukoulis, Phys. Rev. Lett. 95, 203901 (2005)
G. Dolling, C. Enkrich, M. Wegener, J. Zhou, C.M. Soukoulis, S. Linden, Opt. Lett. 30, 3198 (2005)
N. Marcuvitz, J. Schwinger, J. Appl. Phys. 22, 806 (1951)
N. Engheta, A. Salandrino, A. Alú, Phys. Rev. Lett. 95, 095504 (2005)
G.V. Eleftheriades, A.K. Iyer, P.C. Kramer, IEEE Trans. Microw. Theory Technol. 50, 2702 (2002)
A. Lai, C. Caloz, T. Itoh, IEEE Microw. Mag. Sept., 34 (2004)
G.V. Eleftheriades, O. Siddiqui, A.K. Iyer, IEEE Microw. Wireless Comp. Lett. 13, 51 (2003)
C. Caloz, T. Itoh, IEEE Trans. Antennas Propag. 52, 1159 (2004)
D.M. Pozar, Microwave Engineering (Wiley, New York, 2005), 3rd Edn., p. 187
A.M. Nicolson, G.F. Ross, IEEE Trans. Instrum. Meas. 19, 377 (1970)
D.R. Smith, S. Schultz, Phys. Rev. B 65, 195104 (2002)
R. Ulrich, Infrared Phys. 7, 37 (1967)
L. Fu, H. Schweizer, H. Guo, N. Liu, H. Giessen, to be published
CST Microwave Studio, Darmstadt, Germany
Author information
Authors and Affiliations
Corresponding author
Additional information
PACS
41.20.Jb; 78.67.-n; 78.66.Sg
Rights and permissions
About this article
Cite this article
Fu, L., Schweizer, H., Guo, H. et al. Analysis of metamaterials using transmission line models. Appl. Phys. B 86, 425–429 (2007). https://doi.org/10.1007/s00340-006-2557-7
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00340-006-2557-7