Abstract
Third-harmonic generation (THG) was studied from ZnO thin film deposited by the metalorganic chemical vapor deposition (MOCVD) technique on sapphire substrates at different temperatures. A strong THG signal was obtained from the film deposited at an appropriate temperature. The dependence of THG on the deposition temperatures was discussed. A third-order susceptibility χ(3)=3.77×10-12 esu was deduced for a film deposited at 250 °C. This value is similar to that observed from ZnO nanocrystalline films fabricated by pulse-laser deposition (PLD). We conclude that film structure and the crystalline quality is main factors determined the THG in the film.
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42.55. Sa; 77.80.-e; 42.55.Px
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Liu, C., Zhang, B., Binh, N. et al. Third-harmonic generation from ZnO films deposited by MOCVD. Appl. Phys. B 79, 83–86 (2004). https://doi.org/10.1007/s00340-004-1507-5
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DOI: https://doi.org/10.1007/s00340-004-1507-5