Abstract
Light profile microscopy is a new method of thin film imaging in which a microscope forms an image of a laser beam intersecting a thin layer along its depth axis. Emission (luminescence or scatter) from the beam volume is transmitted through a cross sectional view surface and used by a microscope to form an image of the beam propagating through the sample. Fresnel diffraction theory is used in this work to derive a point spread model for a microscope operating in this configuration, assuming that the emission from the source beam is completely incoherent. This theory illustrates the dependence of the image resolution on the laser beam radius, which determines the effective thickness of the system object seen by the microscope. The effect of relative displacement of the source beam center from the object plane of the microscope is evaluated. The present theory shows that radial resolution may be evaluated by means of an object focus envelope and a focal energy distribution computed for the objective lens.
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J.F. Power, S.W. Fu: Apparatus and Method for Light Profile Microscopy, U.S. Patent No. 6614532
J.F. Power, S.W. Fu: Appl. Spectrosc. 53(8), 1507 (1999)
J.F. Power: Rev. Sci. Instrum. 73, 4057 (2002)
J.F. Power, S.W. Fu: Appl. Spectrosc. 58, 166 (2004)
S.W. Fu, J.F. Power: Appl. Spectrosc. 58, 96 (2004)
C.S. Williams, O.A. Becklund: Optics: A Short Course for Engineers and Scientists, John Wiley & Sons (1992)
A. Papoulis: Systems and Transforms with Applications in Optics, R.E. Kreiger Publishing Co., Malabar, Florida (1986)
T. Wilson, C. Sheppard: Theory and Practice of Scanning Optical Microscopy, 1984, Academic Press, London, U.K.
C.J.R. Sheppard, H.J. Matthews: J. Opt. Soc. Am. A4, 1354 (1987)
W.J. Smith: Modern Optical Engineering, McGraw-Hill, New York (1990)
M. Abramowitz, I.A. Stegun: Handbook of Mathematical Functions, NBS Applied Mathematics Series #55, U.S.. Department of Commerce, 1964
A.E. Siegman: An Introduction to Lasers and Masers, 1971, Mc Graw-Hill, New York, Chapt. 8
W.H. Press, S.A. Teukolosky, W.T. Vetterling, B.P. Flannery: Numerical Recipes in C, Cambridge University Press, 1992, pp. 788–818
J.F. Power: unpublished
P.M. Morse, H. Feshbach: Methods of Theoretical Physics, Vol. II, Chapt. 9, McGraw-Hill, New York (1953)
N. Streibl: J. Opt. Soc. Am. A2, 121 (1984)
N.J. Everall: Appl. Spectrosc. 54, 773 (2000)
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42.25Fx; 07.60Pb
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Power, J. Fresnel diffraction model for the point spread of a laser light profile microscope (LPM). Appl. Phys. B 78, 693–703 (2004). https://doi.org/10.1007/s00340-004-1505-7
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DOI: https://doi.org/10.1007/s00340-004-1505-7