Abstract.
The low-frequency electrical noise in semiconductor lasers is measured and used for device-reliability screening, which is a sensitive and non-destructive method. In the experiment, we developed some approaches to improve the validity of reliability screening by using noise criteria. A new method of determining the threshold level of noise criteria is given. The experimental results show that this method is effective.
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Received: 26 September 2002 / Revised version: 28 January 2003 / Published online: 9 April 2003
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Guijun, H., Jiawei, S., Yinbing, G. et al. Noise as reliability screening for semiconductor lasers . Appl Phys B 76, 359–363 (2003). https://doi.org/10.1007/s00340-003-1142-6
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DOI: https://doi.org/10.1007/s00340-003-1142-6