Abstract
In general the quantitative Auger electron spectroscopic analysis of metal fracture surfaces is based on elemental sensitivity factors of the components, segregated impurities or second phases. In metallurgical AES studies mostly the PHI Auger Handbook is used, the relative sensitivities being determined on atomic clean metal and semiconductor surfaces, or insulating compounds (e.g. MgO, KCl, CdS, GaP). In the literature, many contradictory data are communicated. In the analysis of segregated films, however (C, S, P etc.), the contribution of backscattering from the fractured metal might be important.
Some problems of fracture analysis on steel and tungsten are discussed, considering the backscattering correction, escape depth and excitation cross sections as well.
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Gergely, G. Some problems of quantitative AES in fractography. Acta Physica 49, 87–91 (1980). https://doi.org/10.1007/BF03158716
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DOI: https://doi.org/10.1007/BF03158716