Abstract
The interfaces of YBa2Cu3O7−x (YBCO) superconducting thin films grown on (1 102) r-plane A12O3 by pulsed laser deposition have been investigated by a transmission electron microscopy and an Auger electron spectroscopy depth profile. We used the PrBa2Cu3O7−x (PBCO) buffer layer to prevent the interdiffusion and compared the interfaces of YBCO/A12O3 and YBCO/PBCO/A12O3. The intermediate layer in the YBCO film deposited on bare sapphire is visible between the film and the substrate but no boundary layer in the film grown on PBCO buffered sapphire was observed directly by the cross-section image of TEM. The thickness of the intermediate layer in the film on bare sapphire is about 30 nm. This result of TEM observation is consistent with that of AES depth profile.
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S.Y. Lee, K.Y. Rang and D. AhnJEEE Trans. Appl. Supercond. 5, 2563 (1995).
J. Talvacchio, R.G. Wagner and S.H. Talisa,Microwave J. June 105 (1991).
E.K. Hollman, O.G. Vendik, A.G. Zaitsev and B.T. Melekh,Supercond. Sci. Technol. 7, 609 (1994).
B.F. Cole, G.C. Liang, N. Newman, K. Char, G. Zaharchuk and J.S. Martens,Appl. Phys. Lett. 61, 1727 (1992).
J.D. Jorgensen, M.A. Beno, D.G. Hinks, L. Soderholm, K.J. Volin, R.L. Hitterman, J.D. Grace, I.K. Schuller, C.U. Serge, K. Zhang and M.S. Kleefisch,Phys. Rev. B 36, 3608 (1987).
T. Konaka, M. Sato, H. Asano and S. Kubo,J. Supercond. 4, 283 (1991).
V.B. Bragin, V.S. Ilchenko and Kh.S. Bagdassarov,Phys. Lett. A 120, 300 (1987).
S. Y. Lee, Q. X. Jia, W. A. Anderson and D. T. Shaw,J. Appl. Phys. 70, 7170 (1991).
K. Dovidenko, S. Oktyabrsky, D. Tokarchuk, A. Michaltsov and A. Ivanov,Mater. Sci. Eng. B 15, 25 (1992).
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Lee, S.Y., Park, HH. Interfacial properties of YBa2Cu3O7−x thin films on AI2O3 substrates prepared by pulsed laser deposition. J. Electron. Mater. 25, 972–975 (1996). https://doi.org/10.1007/BF02666732
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DOI: https://doi.org/10.1007/BF02666732