Abstract
The use of very cold neutrons, of laser mass spectrometry, and of secondary-ion mass spectrometry has revealed the presence of microprecipitates in commercial Si crystals grown by the Czochralski method and by float zoning.
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Neutron-Physics Laboratory, Lebedev Physics Institute, Academy of Sciences of the USSR. Translated from Preprint No. 149 of the Lebedev Physics Institute, Academy of Sciences of the USSR, Moscow, 1988.
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Ibraev, B.M., Il'ina, E.G., Kalyuzhnaya, G.A. et al. Impurity micropotentials in commercial silicon crystals. J Russ Laser Res 10, 187–197 (1989). https://doi.org/10.1007/BF01120381
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DOI: https://doi.org/10.1007/BF01120381