Abstract
Precision spectroscopy on molecular tellurium is performed by measuring the frequency difference between the observed lines and an eigenfrequency of a high-finesse cavity mode. The mode frequency is derived from a measurement of the cavity's free spectral range taking into account the cavity dispersion due to phase shifts in the dielectric mirror coatings. The experimental technique is based on dual frequency modulation and is applied to determine the transition wavenumbers of several lines in130Te2 near 467 nm with an uncertainty of 2 × 10−8.
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