Abstract
The effect of specimen size on the electrical resistivity at 4.2 K of copper whiskers having transverse dimensions in the order of the electron mean-free path was measured. The experimental data are interpreted by means of a modified Nordheim formula adapted to the exact theory of Dingle. Assuming for copper the value of the productQ 0·λ obtained from the free electron model a specularity parameterp for the surface scattering of conduction electrons is deduced from the diameter dependence of the sample resistivity. Values ofp=0.45 (up to 0.66 in an individual case) andp=0.18 are calculated exhibiting that significant specular reflection is present. Differences in the amount of specular reflection appear to arise from differences in the microscopically observed surface conditions of the whiskers.
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Mende, H.H., Thummes, G. Surface scattering of electrons on copper whiskers and its influence on the electrical resistivity at 4.2 K. Appl. Phys. 6, 93–97 (1975). https://doi.org/10.1007/BF00883555
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DOI: https://doi.org/10.1007/BF00883555