Abstract
The optical and magnetooptical properties of thin film multilayer systems including a ferromagnetic absorbing layer were measured by ellipsometry. These were compared to calculations, using the ellipsometric data of each individual layer and measuring their thicknesses by FECO to determine the refractive indices and magnetooptical parameters of each layer for the calculation of the whole stack. Agreement between calculated and measured properties of the stack showed to be strongly dependent on the precision in measuring film thickness.
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