Abstract
Thermal-wave microscopes usually employ different means for periodic heating and for detection. In this paper the reflected part of the focused heating beam is considered as a possible means for detection. In particular the dark-field and the phase contrast methods are studied.
Article PDF
Similar content being viewed by others
Avoid common mistakes on your manuscript.
References
Y.H. Wong, R.L. Thomas, G.F. Hawkins: Appl. Phys. Lett.32, 538 (1978)
S.N. Jasperson, S.E. Schnatterly: Rev. Sci. Instrum.40, 761 (1969)
T. Wilson, C. Sheppard:Theory and Practice of Scanning Optical Microscopy (Academic, London 1984)
E.A. Ash, E.G.S. Parge (eds.):Rayleigh-Wave Theory and Application, Springer Ser. Wave Phen.2 (Springer, Berlin, Heidelberg 1985)
M. Hoppe, A. Thaer: InMicroscopic Methods in Metals, ed. by U. Gonser, Topics Current Phys.40, (Springer, Berlin, Heidelberg 1986)
T. Nguyan, A. Rosencwaig: Appl. Surf. Sci.24, 57–74 (1985)
A. Rosencwaig: Am. Lab.11, 39 (1979)
G. Busse: InScanned Image Microscopy, ed. by E. A. Ash (Academic, London 1980) p. 341
W.B. Jackson, N.M. Amer, A.C. Boccara, D. Fournier: Appl. Opt.20, 1333 (1981)
S. Ameri, E.A. Ash, V. Neuman, C.R. Patts: Electron. Lett.17, 337–338 (1981)
M.A. Olmstead, N.M. Amer: J. Vac. Sci. Technol.B 1, 751–755 (1983)
A. Rosencwaig, J. Opsal, W.L. Smith, D.L. Willenborg: Appl. Phys. Lett.46, 1013 (1985)
L. Chen, K.H. Yang, S.Y. Zhang: Appl. Phys. Lett.50, 1349–1351 (1987)
A. Lörincz, L. Andor: InPhotothermal and Photoacoustic Phenomena, ed. by P. Hess, J. Pelzl, Springer Ser. Opt. Sci.58 (Springer, Berlin, Heidelberg 1988)
W.B. Jackson, N.M. Amer: J. Appl. Phys.51, 3343–3353 (1980)
W. Nowacki:Thermoelasticity (Pergamon, Oxford 1962)
M.A. Olmstead, N.M. Amer, S. Kohn, D. Fournier, A.C. Boccara: Appl. Phys. A32, 141–154 (1983)
C.J.R. Sheppard, T. Wilson: Philos. Trans. R. Soc.295, 513–536 (1980)
H.H. Hopkins: Proc. R. Soc. Lond. A231, 408–432 (1953)
C.J.R. Sheppard, T. Wilson: Acta25, 315–325 (1978)
M. Born, E. Wolf:Principles of Optics (Pergamon, Oxford 1975)