Abstract
In a previous note [1] we have briefly described a new method of generating electron channelling patterns (ECPs) from selected areas as small as 10 μm across, on the surface of solid specimens. The ECP, which is the reciprocal analogue of the reflection Kikuchi pattern, can be used to orient, and sometimes to identify, the region selected. The details of the method are now described, and ways of reducing the selected area size still further are proposed. Identification of ECPs is facilitated with a channelling map and the preparation of such maps is described.
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References
C. G. Van Essen, E. M. Schulson, and R. H. Donaghay, Nature 225 (1970) 847.
E. M. Schulson and C. G. Van Essen, J. Phys. E. 2 series 2 (1969) 247.
E. M. Schulson ibid 2 series 2 (1969) 361.
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Van Essen, C., Schulson, E.M. & Donaghay, R.H. The generation and identification of SEM channelling patterns from 10 μm selected areas. J Mater Sci 6, 213–217 (1971). https://doi.org/10.1007/BF00550015
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DOI: https://doi.org/10.1007/BF00550015